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Hardware fault tolerance for binary RRAM crossbars

Publication ,  Conference
Chaudhuri, A; Yan, B; Chen, Y; Chakrabarty, K
Published in: Proceedings - International Test Conference
November 1, 2019

Resistive random-access memory (RRAM)-based computing systems (RCS) are being advocated for neural network acceleration. The memristor is the unit cell of an RCS and it is susceptible to process variations and manufacturing defects. Therefore, it is essential to tolerate faulty memristors to ensure intended system operation. We present the architecture of a novel processing element to tolerate both stuck-at and undefined-state faults in binary RRAM cells. We also describe a 4T1R reconfigurable cell-based crossbar design with an ancillary 3T mesh to provide 100% hardware fault tolerance for random and clustered fault distributions for up to 50% fault density. The proposed 4T1R cell is 2.04× smaller than the state-of-the-art neuromorphic SRAM cell. Evaluation results for binary pattern-matching and digit recognition applications demonstrate the effectiveness of our fault tolerance methodology.

Duke Scholars

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781728148236

Publication Date

November 1, 2019

Volume

2019-November
 

Citation

APA
Chicago
ICMJE
MLA
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Chaudhuri, A., Yan, B., Chen, Y., & Chakrabarty, K. (2019). Hardware fault tolerance for binary RRAM crossbars. In Proceedings - International Test Conference (Vol. 2019-November). https://doi.org/10.1109/ITC44170.2019.9000179
Chaudhuri, A., B. Yan, Y. Chen, and K. Chakrabarty. “Hardware fault tolerance for binary RRAM crossbars.” In Proceedings - International Test Conference, Vol. 2019-November, 2019. https://doi.org/10.1109/ITC44170.2019.9000179.
Chaudhuri A, Yan B, Chen Y, Chakrabarty K. Hardware fault tolerance for binary RRAM crossbars. In: Proceedings - International Test Conference. 2019.
Chaudhuri, A., et al. “Hardware fault tolerance for binary RRAM crossbars.” Proceedings - International Test Conference, vol. 2019-November, 2019. Scopus, doi:10.1109/ITC44170.2019.9000179.
Chaudhuri A, Yan B, Chen Y, Chakrabarty K. Hardware fault tolerance for binary RRAM crossbars. Proceedings - International Test Conference. 2019.

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781728148236

Publication Date

November 1, 2019

Volume

2019-November