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A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM

Publication ,  Journal Article
Li, T; Jing, N; Mao, Z; Chen, Y
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
June 1, 2022

Row-column-NVM (RC-NVM) is a new architecture for emerging nonvolatile memory (NVM), such as ReRAM, PCM, and STT-RAM. It leverages the symmetry of crossbar structure and supports both row and column memory accesses. The new architecture is well fit for the applications with different access patterns which suffer from low efficiency and high-energy consumption in traditional memory architecture. However, existing hard failure defensive techniques for emerging NVM are inappropriate for RC-NVM. Therefore, the limited device endurance makes RC-NVM ephemeral and unreliable. In order to overcome this challenge, we propose a hybrid-grained remapping defensive technique to fight against hard failures. By hybrid-grained remapping, we can effectively avoid multiple reads issue of fine-grained remapping and low utilization issue of coarse-grained remapping and significantly increase RC-NVM lifetime with little performance loss. Moreover, motion vector and remap-aware write optimizations are also proposed to further improve RC-NVM reliability and degrade performance loss and energy consumption of write operation. An evaluation shows that the hybrid-grained remapping can increase the lifetime by 61.1% compared to single coarse-grained remapping with only 5% performance loss and 7% energy increase when 10% pages are mapped out. Optimizations can further improve lifetime, performance, and energy by 5%, 11.4%, and 30.5%, respectively.

Duke Scholars

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

June 1, 2022

Volume

41

Issue

6

Start / End Page

1842 / 1854

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Li, T., Jing, N., Mao, Z., & Chen, Y. (2022). A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 41(6), 1842–1854. https://doi.org/10.1109/TCAD.2021.3097288
Li, T., N. Jing, Z. Mao, and Y. Chen. “A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 41, no. 6 (June 1, 2022): 1842–54. https://doi.org/10.1109/TCAD.2021.3097288.
Li T, Jing N, Mao Z, Chen Y. A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2022 Jun 1;41(6):1842–54.
Li, T., et al. “A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 41, no. 6, June 2022, pp. 1842–54. Scopus, doi:10.1109/TCAD.2021.3097288.
Li T, Jing N, Mao Z, Chen Y. A Hybrid-Grained Remapping Defense Scheme Against Hard Failures for Row-Column-NVM. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2022 Jun 1;41(6):1842–1854.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

June 1, 2022

Volume

41

Issue

6

Start / End Page

1842 / 1854

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering