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Toward Fully Automated Machine Learning for Routability Estimator Development

Publication ,  Journal Article
Chang, CC; Pan, J; Xie, Z; Zhang, T; Hu, J; Chen, Y
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
March 1, 2024

The rise of machine learning (ML) technology inspires a boom of its applications in electronic design automation (EDA) and helps improve the degree of automation in chip designs. However, manually crafting ML models remains a complex and time-consuming process because it requires extensive human expertise and tremendous engineering efforts to carefully extract features and design model architectures. In this work, we leverage automated ML techniques to automate the ML model development for routability prediction, a well-established technique that can help to guide cell placement toward routable solutions. We present an automated feature selection method to identify suitable features for model inputs. We develop a neural architecture search method to search for high-quality neural architectures without human interference. Our search method supports various operations and highly flexible connections, leading to architectures significantly different from all previous human-crafted models. Our experimental results demonstrate that our automatically generated models clearly outperform multiple representative manually crafted solutions with a superior 9.9% improvement. Moreover, compared with human-crafted models, which easily take weeks or months to develop, our efficient automated machine learning framework completes the whole model development process with only 1 day.

Duke Scholars

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

March 1, 2024

Volume

43

Issue

3

Start / End Page

970 / 982

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Chang, C. C., Pan, J., Xie, Z., Zhang, T., Hu, J., & Chen, Y. (2024). Toward Fully Automated Machine Learning for Routability Estimator Development. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 43(3), 970–982. https://doi.org/10.1109/TCAD.2023.3330818
Chang, C. C., J. Pan, Z. Xie, T. Zhang, J. Hu, and Y. Chen. “Toward Fully Automated Machine Learning for Routability Estimator Development.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 43, no. 3 (March 1, 2024): 970–82. https://doi.org/10.1109/TCAD.2023.3330818.
Chang CC, Pan J, Xie Z, Zhang T, Hu J, Chen Y. Toward Fully Automated Machine Learning for Routability Estimator Development. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2024 Mar 1;43(3):970–82.
Chang, C. C., et al. “Toward Fully Automated Machine Learning for Routability Estimator Development.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 43, no. 3, Mar. 2024, pp. 970–82. Scopus, doi:10.1109/TCAD.2023.3330818.
Chang CC, Pan J, Xie Z, Zhang T, Hu J, Chen Y. Toward Fully Automated Machine Learning for Routability Estimator Development. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2024 Mar 1;43(3):970–982.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

March 1, 2024

Volume

43

Issue

3

Start / End Page

970 / 982

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering