Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE)
Publication
, Journal Article
Song, P; Macdonald, MC; Behler, RH; Lanning, JD; Wang, MH; Urban, MW; Manduca, A; Zhao, H; Callstrom, MR; Alizad, A; Greenleaf, JF; Chen, S
Duke Scholars
DOI
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Institute of Electrical and Electronics Engineers (IEEE)
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Chicago
ICMJE
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Song, P., Macdonald, M. C., Behler, R. H., Lanning, J. D., Wang, M. H., Urban, M. W., … Chen, S. (n.d.). Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE). https://doi.org/10.1109/tuffc.2015.620201/mm2
Song, Pengfei, Michael C. Macdonald, Russell H. Behler, Justin D. Lanning, Michael H. Wang, Matthew W. Urban, Armando Manduca, et al. “Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE),” n.d. https://doi.org/10.1109/tuffc.2015.620201/mm2.
Song P, Macdonald MC, Behler RH, Lanning JD, Wang MH, Urban MW, et al. Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE).
Song, Pengfei, et al. Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE). Institute of Electrical and Electronics Engineers (IEEE). Crossref, doi:10.1109/tuffc.2015.620201/mm2.
Song P, Macdonald MC, Behler RH, Lanning JD, Wang MH, Urban MW, Manduca A, Zhao H, Callstrom MR, Alizad A, Greenleaf JF, Chen S. Two-Dimensional Shear Wave Elastography on Conventional Ultrasound Scanners With Time-Aligned Sequential Tracking (TAST) and Comb-Push Ultrasound Shear Elastography (CUSE). Institute of Electrical and Electronics Engineers (IEEE);
DOI
Publisher
Institute of Electrical and Electronics Engineers (IEEE)