BayesFLo: Bayesian Fault Localization for Software Testing
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Ji, Y; Lekivetz, R; Mak, S; Morgan, J
Published in: Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023
January 1, 2023
Fault localization is a software testing activity that is critical when software failures occur. We propose a novel Bayesian fault localization method, yielding a principled and probabilistic ranking of suspicious input combinations for identifying the root causes of failures.
Duke Scholars
Published In
Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023
DOI
Publication Date
January 1, 2023
Start / End Page
865 / 866
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Ji, Y., Lekivetz, R., Mak, S., & Morgan, J. (2023). BayesFLo: Bayesian Fault Localization for Software Testing. In Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023 (pp. 865–866). https://doi.org/10.1109/QRS-C60940.2023.00019
Ji, Y., R. Lekivetz, S. Mak, and J. Morgan. “BayesFLo: Bayesian Fault Localization for Software Testing.” In Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023, 865–66, 2023. https://doi.org/10.1109/QRS-C60940.2023.00019.
Ji Y, Lekivetz R, Mak S, Morgan J. BayesFLo: Bayesian Fault Localization for Software Testing. In: Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023. 2023. p. 865–6.
Ji, Y., et al. “BayesFLo: Bayesian Fault Localization for Software Testing.” Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023, 2023, pp. 865–66. Scopus, doi:10.1109/QRS-C60940.2023.00019.
Ji Y, Lekivetz R, Mak S, Morgan J. BayesFLo: Bayesian Fault Localization for Software Testing. Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023. 2023. p. 865–866.
Published In
Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023
DOI
Publication Date
January 1, 2023
Start / End Page
865 / 866