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BayesFLo: Bayesian Fault Localization for Software Testing

Publication ,  Conference
Ji, Y; Lekivetz, R; Mak, S; Morgan, J
Published in: Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023
January 1, 2023

Fault localization is a software testing activity that is critical when software failures occur. We propose a novel Bayesian fault localization method, yielding a principled and probabilistic ranking of suspicious input combinations for identifying the root causes of failures.

Duke Scholars

Published In

Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023

DOI

Publication Date

January 1, 2023

Start / End Page

865 / 866
 

Citation

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Ji, Y., Lekivetz, R., Mak, S., & Morgan, J. (2023). BayesFLo: Bayesian Fault Localization for Software Testing. In Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023 (pp. 865–866). https://doi.org/10.1109/QRS-C60940.2023.00019
Ji, Y., R. Lekivetz, S. Mak, and J. Morgan. “BayesFLo: Bayesian Fault Localization for Software Testing.” In Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023, 865–66, 2023. https://doi.org/10.1109/QRS-C60940.2023.00019.
Ji Y, Lekivetz R, Mak S, Morgan J. BayesFLo: Bayesian Fault Localization for Software Testing. In: Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023. 2023. p. 865–6.
Ji, Y., et al. “BayesFLo: Bayesian Fault Localization for Software Testing.” Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023, 2023, pp. 865–66. Scopus, doi:10.1109/QRS-C60940.2023.00019.
Ji Y, Lekivetz R, Mak S, Morgan J. BayesFLo: Bayesian Fault Localization for Software Testing. Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023. 2023. p. 865–866.

Published In

Proceedings 2023 IEEE 23rd International Conference on Software Quality Reliability and Security Companion Qrs C 2023

DOI

Publication Date

January 1, 2023

Start / End Page

865 / 866