Crystal thickness dependence of Kikuchi line spacing
Publication
, Journal Article
Tan, TY; Bell, WL; Thomas, G
Published in: Philos. Mag. (UK)
1971
Contrary to a common assumption that the Kikuchi line spacing should be the same as that of the corresponding Bragg spot pattern if diffraction geometry is properly considered, experimental results obtained by using high-purity silicon single crystal specimens at 100 kv show that the Kikuchi line spacing can be different from that of the corresponding Bragg spot pattern, depending on the specimen thickness. This result is explained on the basis of dynamical scattering of Kikuchi electrons
Duke Scholars
Published In
Philos. Mag. (UK)
Publication Date
1971
Volume
24
Issue
188
Start / End Page
417 / 424
Citation
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Tan, T. Y., Bell, W. L., & Thomas, G. (1971). Crystal thickness dependence of Kikuchi line spacing. Philos. Mag. (UK), 24(188), 417–424.
Tan, T. Y., W. L. Bell, and G. Thomas. “Crystal thickness dependence of Kikuchi line spacing.” Philos. Mag. (UK) 24, no. 188 (1971): 417–24.
Tan TY, Bell WL, Thomas G. Crystal thickness dependence of Kikuchi line spacing. Philos Mag (UK). 1971;24(188):417–24.
Tan, T. Y., et al. “Crystal thickness dependence of Kikuchi line spacing.” Philos. Mag. (UK), vol. 24, no. 188, 1971, pp. 417–24.
Tan TY, Bell WL, Thomas G. Crystal thickness dependence of Kikuchi line spacing. Philos Mag (UK). 1971;24(188):417–424.
Published In
Philos. Mag. (UK)
Publication Date
1971
Volume
24
Issue
188
Start / End Page
417 / 424