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Interferometric phase-dispersion microscopy

Publication ,  Journal Article
Yang, C; Wax, A; Georgakoudi, I; Hanlon, EB; Badizadegan, K; Dasari, RR; Feld, MS
Published in: Optics Letters
October 15, 2000

We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. © 2000 Optical Society of America.

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Published In

Optics Letters

DOI

ISSN

0146-9592

Publication Date

October 15, 2000

Volume

25

Issue

20

Start / End Page

1526 / 1528

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0206 Quantum Physics
  • 0205 Optical Physics
 

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Yang, C., Wax, A., Georgakoudi, I., Hanlon, E. B., Badizadegan, K., Dasari, R. R., & Feld, M. S. (2000). Interferometric phase-dispersion microscopy. Optics Letters, 25(20), 1526–1528. https://doi.org/10.1364/OL.25.001526
Yang, C., A. Wax, I. Georgakoudi, E. B. Hanlon, K. Badizadegan, R. R. Dasari, and M. S. Feld. “Interferometric phase-dispersion microscopy.” Optics Letters 25, no. 20 (October 15, 2000): 1526–28. https://doi.org/10.1364/OL.25.001526.
Yang C, Wax A, Georgakoudi I, Hanlon EB, Badizadegan K, Dasari RR, et al. Interferometric phase-dispersion microscopy. Optics Letters. 2000 Oct 15;25(20):1526–8.
Yang, C., et al. “Interferometric phase-dispersion microscopy.” Optics Letters, vol. 25, no. 20, Oct. 2000, pp. 1526–28. Scopus, doi:10.1364/OL.25.001526.
Yang C, Wax A, Georgakoudi I, Hanlon EB, Badizadegan K, Dasari RR, Feld MS. Interferometric phase-dispersion microscopy. Optics Letters. 2000 Oct 15;25(20):1526–1528.
Journal cover image

Published In

Optics Letters

DOI

ISSN

0146-9592

Publication Date

October 15, 2000

Volume

25

Issue

20

Start / End Page

1526 / 1528

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0206 Quantum Physics
  • 0205 Optical Physics