Interferometric phase-dispersion microscopy
Publication
, Journal Article
Yang, C; Wax, A; Georgakoudi, I; Hanlon, EB; Badizadegan, K; Dasari, RR; Feld, MS
Published in: Optics Letters
October 15, 2000
We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. © 2000 Optical Society of America.
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Published In
Optics Letters
DOI
ISSN
0146-9592
Publication Date
October 15, 2000
Volume
25
Issue
20
Start / End Page
1526 / 1528
Related Subject Headings
- Optics
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
- 0906 Electrical and Electronic Engineering
- 0206 Quantum Physics
- 0205 Optical Physics
Citation
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Yang, C., Wax, A., Georgakoudi, I., Hanlon, E. B., Badizadegan, K., Dasari, R. R., & Feld, M. S. (2000). Interferometric phase-dispersion microscopy. Optics Letters, 25(20), 1526–1528. https://doi.org/10.1364/OL.25.001526
Published In
Optics Letters
DOI
ISSN
0146-9592
Publication Date
October 15, 2000
Volume
25
Issue
20
Start / End Page
1526 / 1528
Related Subject Headings
- Optics
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
- 0906 Electrical and Electronic Engineering
- 0206 Quantum Physics
- 0205 Optical Physics