IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's
Publication
, Journal Article
Mishra, UK; Brown, AS; Rosenbaum, SE; Delaney, MJ; Vaughn, S; White, K
Published in: IEEE Transactions on Electron Devices
January 1, 1988
Duke Scholars
Published In
IEEE Transactions on Electron Devices
DOI
EISSN
1557-9646
ISSN
0018-9383
Publication Date
January 1, 1988
Volume
35
Issue
12
Start / End Page
2441
Related Subject Headings
- Applied Physics
- 4009 Electronics, sensors and digital hardware
- 0906 Electrical and Electronic Engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Mishra, U. K., Brown, A. S., Rosenbaum, S. E., Delaney, M. J., Vaughn, S., & White, K. (1988). IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's. IEEE Transactions on Electron Devices, 35(12), 2441. https://doi.org/10.1109/16.8861
Mishra, U. K., A. S. Brown, S. E. Rosenbaum, M. J. Delaney, S. Vaughn, and K. White. “IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's.” IEEE Transactions on Electron Devices 35, no. 12 (January 1, 1988): 2441. https://doi.org/10.1109/16.8861.
Mishra UK, Brown AS, Rosenbaum SE, Delaney MJ, Vaughn S, White K. IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's. IEEE Transactions on Electron Devices. 1988 Jan 1;35(12):2441.
Mishra, U. K., et al. “IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's.” IEEE Transactions on Electron Devices, vol. 35, no. 12, Jan. 1988, p. 2441. Scopus, doi:10.1109/16.8861.
Mishra UK, Brown AS, Rosenbaum SE, Delaney MJ, Vaughn S, White K. IIIB-4 Noise Performance of Submicrometer AlInAs-GaInAs HEMT's. IEEE Transactions on Electron Devices. 1988 Jan 1;35(12):2441.
Published In
IEEE Transactions on Electron Devices
DOI
EISSN
1557-9646
ISSN
0018-9383
Publication Date
January 1, 1988
Volume
35
Issue
12
Start / End Page
2441
Related Subject Headings
- Applied Physics
- 4009 Electronics, sensors and digital hardware
- 0906 Electrical and Electronic Engineering