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Analysis of wideband EMI field data

Publication ,  Conference
Whitecotton, B; McManus, T; Kuhn, S; Dalichaouch, Y; Carin, L; Torrione, P; Collins, L
Published in: Proceedings of SPIE - The International Society for Optical Engineering
October 24, 2005

Last year, we reported on a preliminary evaluation of GE's frequency-domain EMI prototype sensor capable of measuring the wideband response of simulant and inert low metal mines at shallow depths over a frequency range from 100 Hz to 150 kHz. Since then, the prototype sensor has undergone further power and sensitivity improvements and has been taken to the field to collect signature data on targets in a calibration grid located at an Army facility in Virginia. The frequency-domain EMI responses have been analyzed by Duke University utilizing matched subspace detector (MSD) processing. The limited amount of data collected, so far, suggests that MSD processing of the frequency-domain data is a robust technique for target detection and identification. However, more data need to be collected for robust testing.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

October 24, 2005

Volume

5794

Issue

PART I

Start / End Page

254 / 262

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Whitecotton, B., McManus, T., Kuhn, S., Dalichaouch, Y., Carin, L., Torrione, P., & Collins, L. (2005). Analysis of wideband EMI field data. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5794, pp. 254–262). https://doi.org/10.1117/12.604191
Whitecotton, B., T. McManus, S. Kuhn, Y. Dalichaouch, L. Carin, P. Torrione, and L. Collins. “Analysis of wideband EMI field data.” In Proceedings of SPIE - The International Society for Optical Engineering, 5794:254–62, 2005. https://doi.org/10.1117/12.604191.
Whitecotton B, McManus T, Kuhn S, Dalichaouch Y, Carin L, Torrione P, et al. Analysis of wideband EMI field data. In: Proceedings of SPIE - The International Society for Optical Engineering. 2005. p. 254–62.
Whitecotton, B., et al. “Analysis of wideband EMI field data.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5794, no. PART I, 2005, pp. 254–62. Scopus, doi:10.1117/12.604191.
Whitecotton B, McManus T, Kuhn S, Dalichaouch Y, Carin L, Torrione P, Collins L. Analysis of wideband EMI field data. Proceedings of SPIE - The International Society for Optical Engineering. 2005. p. 254–262.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

October 24, 2005

Volume

5794

Issue

PART I

Start / End Page

254 / 262

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering