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Comment on `The diffusion of antimony in heavily doped and (sic) n- and p-type silicon' [J. Mater. Res. 1, 705 (1986)]

Publication ,  Journal Article
Morehead, FF; Fair, RB
Published in: J. Mater. Res. (USA)
1987

R.B. Fair et al. have analyzed original data on the effect of heavy, uniform background doping with As and B on the diffusivity of Sb in Si at 1000°-1200°C. Their analysis attributed a role to `electric fields' and led to the conclusion that, for n-type background doping, Sb diffusion is dominated by double-negatively charged vacancies with no contribution from V-. For p-type backgrounds they concluded that donor-acceptor pairing alone retards the diffusion. Morehead shows (1) that electric fields do not play a role in their experiments, (2) that the contribution of V- to Sb diffusion in an n-type background is not zero but is roughly equal to that of V2- for n/ni=10, and (3) that the retardation of Sb diffusion in p-type Si is due both to donor-acceptor pairing and, principally, to the elimination of the contributions of V- and V2-

Duke Scholars

Published In

J. Mater. Res. (USA)

Publication Date

1987

Volume

2

Issue

4

Start / End Page

538 / 541
 

Citation

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Morehead, F. F., & Fair, R. B. (1987). Comment on `The diffusion of antimony in heavily doped and (sic) n- and p-type silicon' [J. Mater. Res. 1, 705 (1986)]. J. Mater. Res. (USA), 2(4), 538–541.
Morehead, F. F., and R. B. Fair. “Comment on `The diffusion of antimony in heavily doped and (sic) n- and p-type silicon' [J. Mater. Res. 1, 705 (1986)].” J. Mater. Res. (USA) 2, no. 4 (1987): 538–41.
Morehead, F. F., and R. B. Fair. “Comment on `The diffusion of antimony in heavily doped and (sic) n- and p-type silicon' [J. Mater. Res. 1, 705 (1986)].” J. Mater. Res. (USA), vol. 2, no. 4, 1987, pp. 538–41.

Published In

J. Mater. Res. (USA)

Publication Date

1987

Volume

2

Issue

4

Start / End Page

538 / 541