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Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics

Publication ,  Journal Article
Fair, RB; Srinivasan, V; Ren, H; Paik, P; Pamula, VK; Pollack, MG
Published in: Technical Digest - International Electron Devices Meeting
December 1, 2003

In this work, results and data are reported on key aspects of sample processing protocols performed on-chip in a digital microfluidic lab-on-a-chip. We report the results of experiments on aspects of sample processing, including on-chip preconcentration and dilution, on-chip sample injection or dispensing, and sample mixing. It is shown that high speed transport and mixing of analytes and reagents can be performed using biological solutions without system contamination.

Duke Scholars

Published In

Technical Digest - International Electron Devices Meeting

ISSN

0163-1918

Publication Date

December 1, 2003

Start / End Page

779 / 782
 

Citation

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Fair, R. B., Srinivasan, V., Ren, H., Paik, P., Pamula, V. K., & Pollack, M. G. (2003). Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics. Technical Digest - International Electron Devices Meeting, 779–782.
Fair, R. B., V. Srinivasan, H. Ren, P. Paik, V. K. Pamula, and M. G. Pollack. “Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics.” Technical Digest - International Electron Devices Meeting, December 1, 2003, 779–82.
Fair RB, Srinivasan V, Ren H, Paik P, Pamula VK, Pollack MG. Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics. Technical Digest - International Electron Devices Meeting. 2003 Dec 1;779–82.
Fair, R. B., et al. “Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics.” Technical Digest - International Electron Devices Meeting, Dec. 2003, pp. 779–82.
Fair RB, Srinivasan V, Ren H, Paik P, Pamula VK, Pollack MG. Electrowetting-Based On-Chip Sample Processing for Integrated Microfluidics. Technical Digest - International Electron Devices Meeting. 2003 Dec 1;779–782.

Published In

Technical Digest - International Electron Devices Meeting

ISSN

0163-1918

Publication Date

December 1, 2003

Start / End Page

779 / 782