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Self-checking and self-diagnosing 32-bit microprocessor multiplier

Publication ,  Journal Article
Yilmaz, M; Hower, DR; Ozev, S; Sorin, DJ
Published in: Proceedings - International Test Conference
January 1, 2006

In this paper, we propose a low-cost fault tolerance technique for microprocessor multipliers, both non-pipelined (NP) and pipelined (P). Our fault tolerant multiplier designs are capable of detecting and correcting errors, diagnosing hard faults, and reconfiguring to take the faulty subunit off-line. We utilize the branch misprediction recovery mechanism in the microprocessor core to take the error detection process off the critical path. Our analysis shows that our scheme provides 99% fault security and, compared to a baseline unprotected multiplier, achieves this fault tolerance with low performance overhead (5% for NP and 2.5% for P multiplier) and reasonably low area (38% NP and 26% P) and power consumption (36% NP and 28.5% P) overheads. © 2006 IEEE.

Duke Scholars

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

Publication Date

January 1, 2006
 

Citation

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Yilmaz, M., Hower, D. R., Ozev, S., & Sorin, D. J. (2006). Self-checking and self-diagnosing 32-bit microprocessor multiplier. Proceedings - International Test Conference. https://doi.org/10.1109/TEST.2006.297634
Yilmaz, M., D. R. Hower, S. Ozev, and D. J. Sorin. “Self-checking and self-diagnosing 32-bit microprocessor multiplier.” Proceedings - International Test Conference, January 1, 2006. https://doi.org/10.1109/TEST.2006.297634.
Yilmaz M, Hower DR, Ozev S, Sorin DJ. Self-checking and self-diagnosing 32-bit microprocessor multiplier. Proceedings - International Test Conference. 2006 Jan 1;
Yilmaz, M., et al. “Self-checking and self-diagnosing 32-bit microprocessor multiplier.” Proceedings - International Test Conference, Jan. 2006. Scopus, doi:10.1109/TEST.2006.297634.
Yilmaz M, Hower DR, Ozev S, Sorin DJ. Self-checking and self-diagnosing 32-bit microprocessor multiplier. Proceedings - International Test Conference. 2006 Jan 1;

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

Publication Date

January 1, 2006