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Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering

Publication ,  Journal Article
Tan, TY; Gösele, U
Published in: Applied Physics A: Materials Science and Processing
1997

Compliant film substrates, which ideally are free-standing thin-film substrates, can be used to grow lattice-mismatched hetero-epitaxial films without misfit dislocation generation to thicknesses beyond the usual critical conditions, because the elastic strain is shared by the epitaxial and the substrate films. Some recent studies have shown that hetero-epitaxial films of superior quality have been grown on thin substrate films fixed to bulky handle wafers obtained via the wafer-bonding method at a rotation angle, which produced a relaxed twist boundary consisting of a screw dislocation network. We consider it as highly unlikely that during growth of the hetero-epitaxial film such a fixed film can be elastically deformed to resemble a free-standing compliant thin-film substrate. In this rapid communication, a tentative interpretation of the role of the fixed-film substrate in producing high-quality hetero-epitaxial films is presented: (i) the screw dislocations gettered away contaminants that would otherwise lead to the generation of growth stacking faults; and (ii) the screw dislocations also allowed the misfit dislocations to be generated in a correlated way so that few threading dislocation segments were left in the bulk of the hetero-epitaxial film.

Duke Scholars

Published In

Applied Physics A: Materials Science and Processing

Publication Date

1997

Volume

64

Issue

6

Start / End Page

631 / 633

Related Subject Headings

  • Applied Physics
  • 0912 Materials Engineering
  • 0205 Optical Physics
  • 0204 Condensed Matter Physics
 

Citation

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Tan, T. Y., & Gösele, U. (1997). Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering. Applied Physics A: Materials Science and Processing, 64(6), 631–633.
Tan, T. Y., and U. Gösele. “Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering.” Applied Physics A: Materials Science and Processing 64, no. 6 (1997): 631–33.
Tan TY, Gösele U. Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering. Applied Physics A: Materials Science and Processing. 1997;64(6):631–3.
Tan, T. Y., and U. Gösele. “Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering.” Applied Physics A: Materials Science and Processing, vol. 64, no. 6, 1997, pp. 631–33.
Tan TY, Gösele U. Twist wafer bonded "fixed-film" versus "compliant" substrates: Correlated misfit dislocation generation and contaminant gettering. Applied Physics A: Materials Science and Processing. 1997;64(6):631–633.

Published In

Applied Physics A: Materials Science and Processing

Publication Date

1997

Volume

64

Issue

6

Start / End Page

631 / 633

Related Subject Headings

  • Applied Physics
  • 0912 Materials Engineering
  • 0205 Optical Physics
  • 0204 Condensed Matter Physics