Transient analysis of minimum duration outage for RF channel in cellular systems
Publication
, Journal Article
Ma, Y; Han, JJ; Trivedi, KS
Published in: IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall
January 1, 1999
Following Mandayam et al., we define outage events as the channel being attenuated for at least a deterministic period of time, τm. Compared with continuous time Markov chain or discrete time Markov chain, a semi-Markov process (SMP) is general enough that it allows the sojourn time to be any distribution function. In this paper, we develop a minimum duration outage model based on an SMP. Closed-form expressions are derived for the time dependent and steady state probabilities of outage. Describing the outage event in the transient regime, our model can reflect the channel fading behavior in a dynamic way.
Duke Scholars
Published In
IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall
ISSN
0740-0551
Publication Date
January 1, 1999
Volume
2
Start / End Page
1698 / 1702
Citation
APA
Chicago
ICMJE
MLA
NLM
Ma, Y., Han, J. J., & Trivedi, K. S. (1999). Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall, 2, 1698–1702.
Ma, Y., J. J. Han, and K. S. Trivedi. “Transient analysis of minimum duration outage for RF channel in cellular systems.” IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall 2 (January 1, 1999): 1698–1702.
Ma Y, Han JJ, Trivedi KS. Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall. 1999 Jan 1;2:1698–702.
Ma, Y., et al. “Transient analysis of minimum duration outage for RF channel in cellular systems.” IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall, vol. 2, Jan. 1999, pp. 1698–702.
Ma Y, Han JJ, Trivedi KS. Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall. 1999 Jan 1;2:1698–1702.
Published In
IEEE VTS 50th Vehicular Technology Conference, VTC 1999-Fall
ISSN
0740-0551
Publication Date
January 1, 1999
Volume
2
Start / End Page
1698 / 1702