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Transient analysis of minimum duration outage for RF channel in cellular systems

Publication ,  Journal Article
Ma, Y; Han, JJ; Trivedi, KS
Published in: IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall
January 1, 1999

Following Mandayam et al., we define outage events as the channel being attenuated for at least a deterministic period of time, τm. Compared with continuous time Markov chain or discrete time Markov chain, a semi-Markov process (SMP) is general enough that it allows the sojourn time to be any distribution function. In this paper, we develop a minimum duration outage model based on an SMP. Closed-form expressions are derived for the time dependent and steady state probabilities of outage. Describing the outage event in the transient regime, our model can reflect the channel fading behavior in a dynamic way.

Duke Scholars

Kishor S. Trivedi
Author Kishor S. Trivedi Electrical and Computer Engineering

Published In

IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall

ISSN

0740-0551

Publication Date

January 1, 1999

Volume

2

Start / End Page

1698 / 1702
 

Citation

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MLA
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Ma, Y., Han, J. J., & Trivedi, K. S. (1999). Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall, 2, 1698–1702.
Ma, Y., J. J. Han, and K. S. Trivedi. “Transient analysis of minimum duration outage for RF channel in cellular systems.” IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall 2 (January 1, 1999): 1698–1702.
Ma Y, Han JJ, Trivedi KS. Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall. 1999 Jan 1;2:1698–702.
Ma, Y., et al. “Transient analysis of minimum duration outage for RF channel in cellular systems.” IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall, vol. 2, Jan. 1999, pp. 1698–702.
Ma Y, Han JJ, Trivedi KS. Transient analysis of minimum duration outage for RF channel in cellular systems. IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall. 1999 Jan 1;2:1698–1702.

Published In

IEEE Vts 50th Vehicular Technology Conference Vtc 1999 Fall

ISSN

0740-0551

Publication Date

January 1, 1999

Volume

2

Start / End Page

1698 / 1702