Measuring structural features using a dual window method for light scattering spectroscopy and Fourier-domain low coherence interferometry
Light scattering spectroscopy (LSS) and Fourier domain low coherence interferometry (fLCI) are used in combination with the dual window method (DW) to measure scattering features from a thick turbid sample. By processing with the DW method, the trade off that hinders spectroscopic OCT is avoided, thus yielding depth resolved spectra with simultaneously high spatial and spectral resolution. The capabilities of the method are demonstrated by analyzing a double layer phantom, where the top layer contains polystyrene beads of diameter d = 4.00 μm, and the bottom layer contains beads of d = 6.98 μm. A white light parallel frequency domain OCT system is used to image the sample. The results show that scattering structure can be assessed accurately and precisely throughout the whole OCT image using LSS and fLCI. © 2010 Copyright SPIE - The International Society for Optical Engineering.
