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Scanning fiber angle-resolved low coherence interferometry.

Publication ,  Journal Article
Zhu, Y; Terry, NG; Wax, A
Published in: Optics letters
October 2009

We present a fiber-optic probe for Fourier-domain angle-resolved low coherence interferometry for the determination of depth-resolved scatterer size. The probe employs a scanning single-mode fiber to collect the angular scattering distribution of the sample, which is analyzed using the Mie theory to obtain the average size of the scatterers. Depth sectioning is achieved with low coherence Mach-Zehnder interferometry. In the sample arm of the interferometer, a fixed fiber illuminates the sample through an imaging lens and a collection fiber samples the backscattered angular distribution by scanning across the Fourier plane image of the sample. We characterize the optical performance of the probe and demonstrate the ability to execute depth-resolved sizing with subwavelength accuracy by using a double-layer phantom containing two sizes of polystyrene microspheres.

Duke Scholars

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

October 2009

Volume

34

Issue

20

Start / End Page

3196 / 3198

Related Subject Headings

  • Spectrophotometry
  • Software
  • Scattering, Radiation
  • Reproducibility of Results
  • Refractometry
  • Phantoms, Imaging
  • Optics and Photonics
  • Optics
  • Optical Fibers
  • Interferometry
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Zhu, Y., Terry, N. G., & Wax, A. (2009). Scanning fiber angle-resolved low coherence interferometry. Optics Letters, 34(20), 3196–3198. https://doi.org/10.1364/ol.34.003196
Journal cover image

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

October 2009

Volume

34

Issue

20

Start / End Page

3196 / 3198

Related Subject Headings

  • Spectrophotometry
  • Software
  • Scattering, Radiation
  • Reproducibility of Results
  • Refractometry
  • Phantoms, Imaging
  • Optics and Photonics
  • Optics
  • Optical Fibers
  • Interferometry