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Materials cartography: Representing and mining materials space using structural and electronic fingerprints

Publication ,  Journal Article
Isayev, O; Fourches, D; Muratov, EN; Oses, C; Rasch, K; Tropsha, A; Curtarolo, S
Published in: Chemistry of Materials
February 10, 2015

As the proliferation of high-throughput approaches in materials science is increasing the wealth of data in the field, the gap between accumulated-information and derived-knowledge widens. We address the issue of scientific discovery in materials databases by introducing novel analytical approaches based on structural and electronic materials fingerprints. The framework is employed to (i) query large databases of materials using similarity concepts, (ii) map the connectivity of materials space (i.e., as a materials cartograms) for rapidly identifying regions with unique organizations/properties, and (iii) develop predictive Quantitative Materials Structure-Property Relationship models for guiding materials design. In this study, we test these fingerprints by seeking target material properties. As a quantitative example, we model the critical temperatures of known superconductors. Our novel materials fingerprinting and materials cartography approaches contribute to the emerging field of materials informatics by enabling effective computational tools to analyze, visualize, model, and design new materials.

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Published In

Chemistry of Materials

DOI

EISSN

1520-5002

ISSN

0897-4756

Publication Date

February 10, 2015

Volume

27

Issue

3

Start / End Page

735 / 743

Related Subject Headings

  • Materials
  • 40 Engineering
  • 34 Chemical sciences
  • 09 Engineering
  • 03 Chemical Sciences
 

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Isayev, O., Fourches, D., Muratov, E. N., Oses, C., Rasch, K., Tropsha, A., & Curtarolo, S. (2015). Materials cartography: Representing and mining materials space using structural and electronic fingerprints. Chemistry of Materials, 27(3), 735–743. https://doi.org/10.1021/cm503507h
Isayev, O., D. Fourches, E. N. Muratov, C. Oses, K. Rasch, A. Tropsha, and S. Curtarolo. “Materials cartography: Representing and mining materials space using structural and electronic fingerprints.” Chemistry of Materials 27, no. 3 (February 10, 2015): 735–43. https://doi.org/10.1021/cm503507h.
Isayev O, Fourches D, Muratov EN, Oses C, Rasch K, Tropsha A, et al. Materials cartography: Representing and mining materials space using structural and electronic fingerprints. Chemistry of Materials. 2015 Feb 10;27(3):735–43.
Isayev, O., et al. “Materials cartography: Representing and mining materials space using structural and electronic fingerprints.” Chemistry of Materials, vol. 27, no. 3, Feb. 2015, pp. 735–43. Scopus, doi:10.1021/cm503507h.
Isayev O, Fourches D, Muratov EN, Oses C, Rasch K, Tropsha A, Curtarolo S. Materials cartography: Representing and mining materials space using structural and electronic fingerprints. Chemistry of Materials. 2015 Feb 10;27(3):735–743.
Journal cover image

Published In

Chemistry of Materials

DOI

EISSN

1520-5002

ISSN

0897-4756

Publication Date

February 10, 2015

Volume

27

Issue

3

Start / End Page

735 / 743

Related Subject Headings

  • Materials
  • 40 Engineering
  • 34 Chemical sciences
  • 09 Engineering
  • 03 Chemical Sciences