Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits
Publication
, Conference
Radauscher, EJ; Gilchrist, KH; Di Dona, ST; Russell, ZE; Piascik, JR; Parker, CB; Stoner, BR; Glass, JT
Published in: Technical Digest - International Electron Devices Meeting, IEDM
February 16, 2015
This work evaluates crosstalk and transmission efficiency in multi-integrated field emission vacuum microelectronic devices (FE-VMDs). Experimental evidence showed that proximity effects cannot be neglected, therefore indicating a need for additional control to take full advantage of the potential microfabricated packing density. Simulations were used to understand the root cause, design structural solutions, and improve overall device performance. Furthermore, charged particle transmission was experimentally investigated for initial structures and new design features are proposed for improved performance.
Duke Scholars
Published In
Technical Digest - International Electron Devices Meeting, IEDM
DOI
ISSN
0163-1918
Publication Date
February 16, 2015
Volume
2016-February
Start / End Page
33.2.1 / 33.2.4
Citation
APA
Chicago
ICMJE
MLA
NLM
Radauscher, E. J., Gilchrist, K. H., Di Dona, S. T., Russell, Z. E., Piascik, J. R., Parker, C. B., … Glass, J. T. (2015). Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits. In Technical Digest - International Electron Devices Meeting, IEDM (Vol. 2016-February, pp. 33.2.1-33.2.4). https://doi.org/10.1109/IEDM.2015.7409819
Radauscher, E. J., K. H. Gilchrist, S. T. Di Dona, Z. E. Russell, J. R. Piascik, C. B. Parker, B. R. Stoner, and J. T. Glass. “Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits.” In Technical Digest - International Electron Devices Meeting, IEDM, 2016-February:33.2.1-33.2.4, 2015. https://doi.org/10.1109/IEDM.2015.7409819.
Radauscher EJ, Gilchrist KH, Di Dona ST, Russell ZE, Piascik JR, Parker CB, et al. Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits. In: Technical Digest - International Electron Devices Meeting, IEDM. 2015. p. 33.2.1-33.2.4.
Radauscher, E. J., et al. “Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits.” Technical Digest - International Electron Devices Meeting, IEDM, vol. 2016-February, 2015, pp. 33.2.1-33.2.4. Scopus, doi:10.1109/IEDM.2015.7409819.
Radauscher EJ, Gilchrist KH, Di Dona ST, Russell ZE, Piascik JR, Parker CB, Stoner BR, Glass JT. Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits. Technical Digest - International Electron Devices Meeting, IEDM. 2015. p. 33.2.1-33.2.4.
Published In
Technical Digest - International Electron Devices Meeting, IEDM
DOI
ISSN
0163-1918
Publication Date
February 16, 2015
Volume
2016-February
Start / End Page
33.2.1 / 33.2.4