High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study
Publication
, Conference
Senlik, O; Woods, C; Jokerst, NM
Published in: Proceedings of IEEE Sensors
January 5, 2016
An innovative densely packed silicon photodiode array enables measurements of spatially- and spectrally resolved diffuse reflectance from liquid phantoms with a wide range of absorption concentrations. Experimentally measured reflectance spectra and the forward Monte Carlo simulations are in good agreement, with mean error < 10%.
Duke Scholars
Published In
Proceedings of IEEE Sensors
DOI
EISSN
2168-9229
ISSN
1930-0395
Publication Date
January 5, 2016
Volume
0
Citation
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Chicago
ICMJE
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Senlik, O., Woods, C., & Jokerst, N. M. (2016). High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study. In Proceedings of IEEE Sensors (Vol. 0). https://doi.org/10.1109/ICSENS.2016.7808487
Senlik, O., C. Woods, and N. M. Jokerst. “High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study.” In Proceedings of IEEE Sensors, Vol. 0, 2016. https://doi.org/10.1109/ICSENS.2016.7808487.
Senlik O, Woods C, Jokerst NM. High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study. In: Proceedings of IEEE Sensors. 2016.
Senlik, O., et al. “High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study.” Proceedings of IEEE Sensors, vol. 0, 2016. Scopus, doi:10.1109/ICSENS.2016.7808487.
Senlik O, Woods C, Jokerst NM. High pixel density concentric si spatially resolved diffuse reflectance probe: Wide absorption range phantom study. Proceedings of IEEE Sensors. 2016.
Published In
Proceedings of IEEE Sensors
DOI
EISSN
2168-9229
ISSN
1930-0395
Publication Date
January 5, 2016
Volume
0