Detecting Anomalies Using End-to-End Path Measurements.
Publication
, Conference
Naidu, KVM; Panigrahi, D; Rastogi, R
Published in: INFOCOM
2008
Duke Scholars
Published In
INFOCOM
ISBN
978-1-4244-2026-1
Publication Date
2008
Start / End Page
1849 / 1857
Publisher
IEEE
Citation
APA
Chicago
ICMJE
MLA
NLM
Naidu, K. V. M., Panigrahi, D., & Rastogi, R. (2008). Detecting Anomalies Using End-to-End Path Measurements. In INFOCOM (pp. 1849–1857). IEEE.
Naidu, K. V. M., Debmalya Panigrahi, and Rajeev Rastogi. “Detecting Anomalies Using End-to-End Path Measurements.” In INFOCOM, 1849–57. IEEE, 2008.
Naidu KVM, Panigrahi D, Rastogi R. Detecting Anomalies Using End-to-End Path Measurements. In: INFOCOM. IEEE; 2008. p. 1849–57.
Naidu, K. V. M., et al. “Detecting Anomalies Using End-to-End Path Measurements.” INFOCOM, IEEE, 2008, pp. 1849–57.
Naidu KVM, Panigrahi D, Rastogi R. Detecting Anomalies Using End-to-End Path Measurements. INFOCOM. IEEE; 2008. p. 1849–1857.
Published In
INFOCOM
ISBN
978-1-4244-2026-1
Publication Date
2008
Start / End Page
1849 / 1857
Publisher
IEEE