Skip to main content

A generic and robust approach for the analysis of spot array images

Publication ,  Journal Article
Brändle, N; Bischof, H; Lapp, H
Published in: Proceedings of SPIE the International Society for Optical Engineering
January 1, 2001

We present a generic and robust image analysis approach applicable to image data resulting from a broad class of hybridization experiments. The ultimate image analysis goal is to automatically assign a quantity to every array element (spot), giving information about the hybridization signal. Irrespective of the quantification strategy, the most important preliminary information to extract about a spot is the mapping between its location in the digital image and its position in the spot grid (grid fitting). We present a grid fitting approach divided into a spot amplification step (matched filter), a rotation estimation step (Radon transform) and a grid spanning step. Quantification of the hybridization signals is performed with different fitting approaches. The primary approach is a robust fitting of a parametric model with the help of M-estimators. The main advantage of parametric spot fitting is its ability to cope with overlapping spots. If the goodness-of-fit is too bad, a semi-parametric spot fitting is employed.

Duke Scholars

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4266

Start / End Page

1 / 12

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Brändle, N., Bischof, H., & Lapp, H. (2001). A generic and robust approach for the analysis of spot array images. Proceedings of SPIE the International Society for Optical Engineering, 4266, 1–12. https://doi.org/10.1117/12.427983
Brändle, N., H. Bischof, and H. Lapp. “A generic and robust approach for the analysis of spot array images.” Proceedings of SPIE the International Society for Optical Engineering 4266 (January 1, 2001): 1–12. https://doi.org/10.1117/12.427983.
Brändle N, Bischof H, Lapp H. A generic and robust approach for the analysis of spot array images. Proceedings of SPIE the International Society for Optical Engineering. 2001 Jan 1;4266:1–12.
Brändle, N., et al. “A generic and robust approach for the analysis of spot array images.” Proceedings of SPIE the International Society for Optical Engineering, vol. 4266, Jan. 2001, pp. 1–12. Scopus, doi:10.1117/12.427983.
Brändle N, Bischof H, Lapp H. A generic and robust approach for the analysis of spot array images. Proceedings of SPIE the International Society for Optical Engineering. 2001 Jan 1;4266:1–12.

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4266

Start / End Page

1 / 12

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering