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Ultra-thin infrared metamaterial detector for multicolor imaging applications.

Publication ,  Journal Article
Montoya, JA; Tian, Z-B; Krishna, S; Padilla, WJ
Published in: Optics express
September 2017

The next generation of infrared imaging systems requires control of fundamental electromagnetic processes - absorption, polarization, spectral bandwidth - at the pixel level to acquire desirable information about the environment with low system latency. Metamaterial absorbers have sparked interest in the infrared imaging community for their ability to enhance absorption of incoming radiation with color, polarization and/or phase information. However, most metamaterial-based sensors fail to focus incoming radiation into the active region of a ultra-thin detecting element, thus achieving poor detection metrics. Here our multifunctional metamaterial absorber is directly integrated with a novel mid-wave infrared (MWIR) and long-wave infrared (LWIR) detector with an ultra-thin (~λ/15) InAs/GaSb Type-II superlattice (T2SL) interband cascade detector. The deep sub-wavelength metamaterial detector architecture proposed and demonstrated here, thus significantly improves the detection quantum efficiency (QE) and absorption of incoming radiation in a regime typically dominated by Fabry-Perot etalons. Our work evinces the ability of multifunctional metamaterials to realize efficient wavelength selective detection across the infrared spectrum for enhanced multispectral infrared imaging applications.

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Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

September 2017

Volume

25

Issue

19

Start / End Page

23343 / 23355

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics
 

Citation

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Montoya, J. A., Tian, Z.-B., Krishna, S., & Padilla, W. J. (2017). Ultra-thin infrared metamaterial detector for multicolor imaging applications. Optics Express, 25(19), 23343–23355. https://doi.org/10.1364/oe.25.023343
Montoya, John A., Zhao-Bing Tian, Sanjay Krishna, and Willie J. Padilla. “Ultra-thin infrared metamaterial detector for multicolor imaging applications.Optics Express 25, no. 19 (September 2017): 23343–55. https://doi.org/10.1364/oe.25.023343.
Montoya JA, Tian Z-B, Krishna S, Padilla WJ. Ultra-thin infrared metamaterial detector for multicolor imaging applications. Optics express. 2017 Sep;25(19):23343–55.
Montoya, John A., et al. “Ultra-thin infrared metamaterial detector for multicolor imaging applications.Optics Express, vol. 25, no. 19, Sept. 2017, pp. 23343–55. Epmc, doi:10.1364/oe.25.023343.
Montoya JA, Tian Z-B, Krishna S, Padilla WJ. Ultra-thin infrared metamaterial detector for multicolor imaging applications. Optics express. 2017 Sep;25(19):23343–23355.
Journal cover image

Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

September 2017

Volume

25

Issue

19

Start / End Page

23343 / 23355

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics