Estimation of system reliability using a semiparametric model
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Wu, L; Teravainen, T; Kaiser, G; Anderson, R; Boulanger, A; Rudin, C
Published in: IEEE 2011 EnergyTech, ENERGYTECH 2011
August 17, 2011
An important problem in reliability engineering is to predict the failure rate, that is, the frequency with which an engineered system or component fails. This paper presents a new method of estimating failure rate using a semiparametric model with Gaussian process smoothing. The method is able to provide accurate estimation based on historical data and it does not make strong a priori assumptions of failure rate pattern (e.g., constant or monotonic). Our experiments of applying this method in power system failure data compared with other models show its efficacy and accuracy. This method can be used in estimating reliability for many other systems, such as software systems or components. © 2011 IEEE.
Duke Scholars
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IEEE 2011 EnergyTech, ENERGYTECH 2011
DOI
Publication Date
August 17, 2011
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Wu, L., Teravainen, T., Kaiser, G., Anderson, R., Boulanger, A., & Rudin, C. (2011). Estimation of system reliability using a semiparametric model. In IEEE 2011 EnergyTech, ENERGYTECH 2011. https://doi.org/10.1109/EnergyTech.2011.5948537
Wu, L., T. Teravainen, G. Kaiser, R. Anderson, A. Boulanger, and C. Rudin. “Estimation of system reliability using a semiparametric model.” In IEEE 2011 EnergyTech, ENERGYTECH 2011, 2011. https://doi.org/10.1109/EnergyTech.2011.5948537.
Wu L, Teravainen T, Kaiser G, Anderson R, Boulanger A, Rudin C. Estimation of system reliability using a semiparametric model. In: IEEE 2011 EnergyTech, ENERGYTECH 2011. 2011.
Wu, L., et al. “Estimation of system reliability using a semiparametric model.” IEEE 2011 EnergyTech, ENERGYTECH 2011, 2011. Scopus, doi:10.1109/EnergyTech.2011.5948537.
Wu L, Teravainen T, Kaiser G, Anderson R, Boulanger A, Rudin C. Estimation of system reliability using a semiparametric model. IEEE 2011 EnergyTech, ENERGYTECH 2011. 2011.
Published In
IEEE 2011 EnergyTech, ENERGYTECH 2011
DOI
Publication Date
August 17, 2011