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Open data and open code for S&T assessment

Publication ,  Journal Article
Börner, K; Ma, N; Duhon, RJ; Zoss, AM
Published in: IEEE Intelligent Systems
July 1, 2009

The open data and open code that can be freely used for S&T assessment together with sample analyses has been discussed. The Scholarly Database (SDB) at Indiana University offers several advantages for S&T studies such as search queries for an author, investigator, or inventor name or topic term can be run against multiple databases offering simultaneous retrieval of all funding, publications, and patents relevant for a query. The Network Workbench (NWB) is a tool that supports researchers, educators, and practitioners interested in the study of biomedical, social and behavioral science, physics, and other networks. The NWB tool is provided with an associated community wiki, extensive documentation of algorithms, and sample data sets. The users can combine the SDB with the NWB tool to study S&T data sets professionally in a manner that anyone can easily replicate. The AI search results generate a US Patent and Trademark Office (USPTO) citation network that has 3,614 nodes, 8,393 edges, and 107 components.

Duke Scholars

Published In

IEEE Intelligent Systems

ISSN

1541-1672

Publication Date

July 1, 2009

Volume

24

Issue

4

Start / End Page

78 / 81

Related Subject Headings

  • Artificial Intelligence & Image Processing
  • 46 Information and computing sciences
  • 40 Engineering
  • 0906 Electrical and Electronic Engineering
  • 0806 Information Systems
  • 0801 Artificial Intelligence and Image Processing
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Börner, K., Ma, N., Duhon, R. J., & Zoss, A. M. (2009). Open data and open code for S&T assessment. IEEE Intelligent Systems, 24(4), 78–81.
Börner, K., N. Ma, R. J. Duhon, and A. M. Zoss. “Open data and open code for S&T assessment.” IEEE Intelligent Systems 24, no. 4 (July 1, 2009): 78–81.
Börner K, Ma N, Duhon RJ, Zoss AM. Open data and open code for S&T assessment. IEEE Intelligent Systems. 2009 Jul 1;24(4):78–81.
Börner, K., et al. “Open data and open code for S&T assessment.” IEEE Intelligent Systems, vol. 24, no. 4, July 2009, pp. 78–81.
Börner K, Ma N, Duhon RJ, Zoss AM. Open data and open code for S&T assessment. IEEE Intelligent Systems. 2009 Jul 1;24(4):78–81.

Published In

IEEE Intelligent Systems

ISSN

1541-1672

Publication Date

July 1, 2009

Volume

24

Issue

4

Start / End Page

78 / 81

Related Subject Headings

  • Artificial Intelligence & Image Processing
  • 46 Information and computing sciences
  • 40 Engineering
  • 0906 Electrical and Electronic Engineering
  • 0806 Information Systems
  • 0801 Artificial Intelligence and Image Processing