Measurement of AlxGa1-xN Refractive Indices

Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1-xN epitaxial layers with 0 ≤ x ≤ 1.0 throughout the visible wavelength region 457 nm < λ < 800 nm. The dispersion, measured by a prism coupling waveguide technique is found to be well described by a first-order Sellmeier dispersion formula parameterized as functions of x and λ.