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Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples

Publication ,  Conference
Walker, TE; Smith, DR
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 2012

This paper describes the use of a swept-charge device (SCD) silicon X-ray detector in a laboratory based X-ray fluorescence (XRF) facility for calculating elemental abundance ratios from planetary analogue powder samples. The facility was developed to support the Chandrayaan-1 X-ray Spectrometer (C1XS) detector development and calibration activities prior to the flight of the instrument onboard the Indian Space Research Organisation (ISRO) Chandrayaan-1 mission to the Moon in 2008. The test facility has subsequently been used to carry out XRF analysis of homogenous samples made from mixtures of MgO, Al2O 3 and SiO2 powders, all of grain size <44 μm, across a range of mixture ratios and at a high level of X-ray flux data in order to develop an algorithm which will allow the calculation of elemental abundance ratios. This paper also presents an analysis of XRF data collected from lunar regolith simulant JSC-1A and an Etna Basalt powder sample to enable calibration of various model parameters. The operation of the SCD, the XRF test facility, the sample preparation methodology and the process of obtaining elemental abundance ratios from planetary analogue samples using the test facility are discussed in this paper. © 2012 SPIE.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2012

Volume

8453

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Walker, T. E., & Smith, D. R. (2012). Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8453). https://doi.org/10.1117/12.926978
Walker, T. E., and D. R. Smith. “Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 8453, 2012. https://doi.org/10.1117/12.926978.
Walker TE, Smith DR. Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples. In: Proceedings of SPIE - The International Society for Optical Engineering. 2012.
Walker, T. E., and D. R. Smith. “Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 8453, 2012. Scopus, doi:10.1117/12.926978.
Walker TE, Smith DR. Development of a laboratory based XRF facility for measuring elemental abundance ratios in planetary analogue powder samples. Proceedings of SPIE - The International Society for Optical Engineering. 2012.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2012

Volume

8453

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering