Scholars@Duke publication: The effect of protons on the performance of second generation Swept Charge Devices

The effect of protons on the performance of second generation Swept Charge Devices

Publication , Journal Article

Gow, JPD; Holland, AD; Pool, PJ; Smith, DR

Published in: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

July 11, 2012

Published version (DOI)

The e2v technologies Swept Charge Device (SCD) was developed as a large area detector for X-ray Fluorescence (XRF) analysis, achieving near Fano-limited spectroscopy at -15 °C. The SCD was flown in the XRF instruments onboard the European Space Agency's SMART-1 and the Indian Space Research Organisation's Chandrayaan-1 lunar missions. The second generation SCD, proposed for use in the soft X-ray Spectrometer on the Chandrayaan-2 lunar orbiter and the soft X-ray imager on China's HXMT mission, was developed, in part, using the findings of the radiation damage studies performed for the Chandrayaan-1 X-ray Spectrometer. This paper discusses the factor of two improvements in radiation tolerance achieved in the second generation SCD, the different SCD sizes produced and their advantages for future XRF instruments, for example through reduced shielding mass or higher operating temperatures. © 2012 Elsevier B.V. All rights reserved.

Duke Scholars

Author David R. Smith Electrical and Computer Engineering

Published In

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

DOI

10.1016/j.nima.2012.04.013

ISSN

0168-9002

Publication Date

July 11, 2012

Volume

680

Start / End Page

86 / 89

Related Subject Headings

Nuclear & Particles Physics
5106 Nuclear and plasma physics
0299 Other Physical Sciences
0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
0201 Astronomical and Space Sciences

Citation

APA

Chicago

ICMJE

MLA

NLM

Gow, J. P. D., Holland, A. D., Pool, P. J., & Smith, D. R. (2012). The effect of protons on the performance of second generation Swept Charge Devices. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 680, 86–89. https://doi.org/10.1016/j.nima.2012.04.013

Gow, J. P. D., A. D. Holland, P. J. Pool, and D. R. Smith. “The effect of protons on the performance of second generation Swept Charge Devices.” Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 680 (July 11, 2012): 86–89. https://doi.org/10.1016/j.nima.2012.04.013.

Gow JPD, Holland AD, Pool PJ, Smith DR. The effect of protons on the performance of second generation Swept Charge Devices. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2012 Jul 11;680:86–9.

Gow, J. P. D., et al. “The effect of protons on the performance of second generation Swept Charge Devices.” Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 680, July 2012, pp. 86–89. Scopus, doi:10.1016/j.nima.2012.04.013.

Published In

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

DOI

10.1016/j.nima.2012.04.013

ISSN

0168-9002

Publication Date

July 11, 2012

Volume

680

Start / End Page

86 / 89

Related Subject Headings

Nuclear & Particles Physics
5106 Nuclear and plasma physics
0299 Other Physical Sciences
0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
0201 Astronomical and Space Sciences