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Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument

Publication ,  Conference
Gow, J; Smith, DR; Holland, AD; Maddison, B; Howe, C; Sreekumar, P; Huovelin, J; Grande, M
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 2007

The Indian Space Research Organisation (ISRO) Chandrayaan-1 mission is India's first lunar spacecraft, containing a suite of instruments to carry out high-resolution remote sensing of the Moon at visible, near infrared and X-ray wavelengths. Due for launch in early 2008, the spacecraft will carry out its two year mission in a polar orbit around the Moon at an altitude of 100 km. One of the eleven instruments in the spacecraft payload is the Chandrayaan-1 X-ray Spectrometer (C1XS), a descendant of the successful D-CIXS instrument that flew on the European Space Agency SMART-1 lunar mission launched in 2003. C1XS consists of 24 swept-charge device (SCD) silicon X-ray detectors arranged in 6 modules that will carry out high quality X-ray spectroscopic mapping of the Moon using the technique of X-ray fluorescence. This paper presents an overview of the Chandrayaan-1 mission and specifically the C1XS instrument and describes the development of an SCD test facility, proton irradiation characterisation and screening of candidate SCD devices for the mission.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2007

Volume

6686

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Gow, J., Smith, D. R., Holland, A. D., Maddison, B., Howe, C., Sreekumar, P., … Grande, M. (2007). Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6686). https://doi.org/10.1117/12.734062
Gow, J., D. R. Smith, A. D. Holland, B. Maddison, C. Howe, P. Sreekumar, J. Huovelin, and M. Grande. “Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 6686, 2007. https://doi.org/10.1117/12.734062.
Gow J, Smith DR, Holland AD, Maddison B, Howe C, Sreekumar P, et al. Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument. In: Proceedings of SPIE - The International Society for Optical Engineering. 2007.
Gow, J., et al. “Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 6686, 2007. Scopus, doi:10.1117/12.734062.
Gow J, Smith DR, Holland AD, Maddison B, Howe C, Sreekumar P, Huovelin J, Grande M. Characterisation of swept-charge devices for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument. Proceedings of SPIE - The International Society for Optical Engineering. 2007.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2007

Volume

6686

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering