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Recursive Feature Elimination by Sensitivity Testing.

Publication ,  Conference
Escanilla, NS; Hellerstein, L; Kleiman, R; Kuang, Z; Shull, JD; Page, D
Published in: Proc Int Conf Mach Learn Appl
December 2018

There is great interest in methods to improve human insight into trained non-linear models. Leading approaches include producing a ranking of the most relevant features, a non-trivial task for non-linear models. We show theoretically and empirically the benefit of a novel version of recursive feature elimination (RFE) as often used with SVMs; the key idea is a simple twist on the kinds of sensitivity testing employed in computational learning theory with membership queries (e.g., [1]). With membership queries, one can check whether changing the value of a feature in an example changes the label. In the real-world, we usually cannot get answers to such queries, so our approach instead makes these queries to a trained (imperfect) non-linear model. Because SVMs are widely used in bioinformatics, our empirical results use a real-world cancer genomics problem; because ground truth is not known for this task, we discuss the potential insights provided. We also evaluate on synthetic data where ground truth is known.

Duke Scholars

Published In

Proc Int Conf Mach Learn Appl

DOI

Publication Date

December 2018

Volume

2018

Start / End Page

40 / 47

Location

United States
 

Citation

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Escanilla, N. S., Hellerstein, L., Kleiman, R., Kuang, Z., Shull, J. D., & Page, D. (2018). Recursive Feature Elimination by Sensitivity Testing. In Proc Int Conf Mach Learn Appl (Vol. 2018, pp. 40–47). United States. https://doi.org/10.1109/ICMLA.2018.00014
Escanilla, Nicholas Sean, Lisa Hellerstein, Ross Kleiman, Zhaobin Kuang, James D. Shull, and David Page. “Recursive Feature Elimination by Sensitivity Testing.” In Proc Int Conf Mach Learn Appl, 2018:40–47, 2018. https://doi.org/10.1109/ICMLA.2018.00014.
Escanilla NS, Hellerstein L, Kleiman R, Kuang Z, Shull JD, Page D. Recursive Feature Elimination by Sensitivity Testing. In: Proc Int Conf Mach Learn Appl. 2018. p. 40–7.
Escanilla, Nicholas Sean, et al. “Recursive Feature Elimination by Sensitivity Testing.Proc Int Conf Mach Learn Appl, vol. 2018, 2018, pp. 40–47. Pubmed, doi:10.1109/ICMLA.2018.00014.
Escanilla NS, Hellerstein L, Kleiman R, Kuang Z, Shull JD, Page D. Recursive Feature Elimination by Sensitivity Testing. Proc Int Conf Mach Learn Appl. 2018. p. 40–47.

Published In

Proc Int Conf Mach Learn Appl

DOI

Publication Date

December 2018

Volume

2018

Start / End Page

40 / 47

Location

United States