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Multiple testing under dependence via semiparametric graphical models

Publication ,  Conference
Liu, J; Zhang, C; Burnside, E; Page, D
Published in: 31st International Conference on Machine Learning, ICML 2014
January 1, 2014

It has been shown that graphical models can be used to leverage the dependence in large- scale multiple testing problems with significantly improved performance (Sun & Cai, 2009; Liu et al., 2012). These graphical models are fully parametric and require that we know the pa-rameterization of f1 - the density function of the test statistic under the alternative hypothesis. However in practice, f1 is often heterogeneous, and cannot be estimated with a simple parametric distribution. We propose a novel semiparametric approach for multiple testing under dependence, which estimates f1 adaptively. This semiparametric approach exactly generalizes the local FDR procedure (Efron et al., 2001) and connects with the BH procedure (Benjamini & Hochberg, 1995). A variety of simulations show that our semiparametric approach outperforms classical procedures which assume independence and the parametric approaches which capture dependence.

Duke Scholars

Published In

31st International Conference on Machine Learning, ICML 2014

Publication Date

January 1, 2014

Volume

3

Start / End Page

2601 / 2613
 

Citation

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MLA
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Liu, J., Zhang, C., Burnside, E., & Page, D. (2014). Multiple testing under dependence via semiparametric graphical models. In 31st International Conference on Machine Learning, ICML 2014 (Vol. 3, pp. 2601–2613).
Liu, J., C. Zhang, E. Burnside, and D. Page. “Multiple testing under dependence via semiparametric graphical models.” In 31st International Conference on Machine Learning, ICML 2014, 3:2601–13, 2014.
Liu J, Zhang C, Burnside E, Page D. Multiple testing under dependence via semiparametric graphical models. In: 31st International Conference on Machine Learning, ICML 2014. 2014. p. 2601–13.
Liu, J., et al. “Multiple testing under dependence via semiparametric graphical models.” 31st International Conference on Machine Learning, ICML 2014, vol. 3, 2014, pp. 2601–13.
Liu J, Zhang C, Burnside E, Page D. Multiple testing under dependence via semiparametric graphical models. 31st International Conference on Machine Learning, ICML 2014. 2014. p. 2601–2613.

Published In

31st International Conference on Machine Learning, ICML 2014

Publication Date

January 1, 2014

Volume

3

Start / End Page

2601 / 2613