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Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis

Publication ,  Conference
Ding, Y; Coccarelli, D; Hurlock, A; Greenberg, JA; Gehm, M; Ashok, A
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2020

We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2020

Volume

11404

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Ding, Y., Coccarelli, D., Hurlock, A., Greenberg, J. A., Gehm, M., & Ashok, A. (2020). Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 11404). https://doi.org/10.1117/12.2558267
Ding, Y., D. Coccarelli, A. Hurlock, J. A. Greenberg, M. Gehm, and A. Ashok. “Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 11404, 2020. https://doi.org/10.1117/12.2558267.
Ding Y, Coccarelli D, Hurlock A, Greenberg JA, Gehm M, Ashok A. Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In: Proceedings of SPIE - The International Society for Optical Engineering. 2020.
Ding, Y., et al. “Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 11404, 2020. Scopus, doi:10.1117/12.2558267.
Ding Y, Coccarelli D, Hurlock A, Greenberg JA, Gehm M, Ashok A. Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. Proceedings of SPIE - The International Society for Optical Engineering. 2020.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2020

Volume

11404

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering