Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis
Publication
, Conference
Ding, Y; Coccarelli, D; Hurlock, A; Greenberg, JA; Gehm, M; Ashok, A
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2020
We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2020
Volume
11404
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Ding, Y., Coccarelli, D., Hurlock, A., Greenberg, J. A., Gehm, M., & Ashok, A. (2020). Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 11404). https://doi.org/10.1117/12.2558267
Ding, Y., D. Coccarelli, A. Hurlock, J. A. Greenberg, M. Gehm, and A. Ashok. “Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 11404, 2020. https://doi.org/10.1117/12.2558267.
Ding Y, Coccarelli D, Hurlock A, Greenberg JA, Gehm M, Ashok A. Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In: Proceedings of SPIE - The International Society for Optical Engineering. 2020.
Ding, Y., et al. “Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 11404, 2020. Scopus, doi:10.1117/12.2558267.
Ding Y, Coccarelli D, Hurlock A, Greenberg JA, Gehm M, Ashok A. Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. Proceedings of SPIE - The International Society for Optical Engineering. 2020.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2020
Volume
11404
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering