Scholars@Duke publication: Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data

Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data

Publication , Journal Article

SPIE

Published in: SPIE Newsroom

March 11, 2013

Published version (DOI) Publisher Link

Duke Scholars

Author Geoffrey D Rubin Radiology

Published In

SPIE Newsroom

DOI

10.1117/2.3201303.11

EISSN

1818-2259

Publication Date

March 11, 2013

Publisher

SPIE-Intl Soc Optical Eng

Citation

APA

Chicago

ICMJE

MLA

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SPIE. (2013). Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data. SPIE Newsroom. https://doi.org/10.1117/2.3201303.11

SPIE. “Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data.” SPIE Newsroom, March 11, 2013. https://doi.org/10.1117/2.3201303.11.

SPIE. Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data. SPIE Newsroom. 2013 Mar 11;

SPIE. “Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data.” SPIE Newsroom, SPIE-Intl Soc Optical Eng, Mar. 2013. Crossref, doi:10.1117/2.3201303.11.

SPIE. Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data. SPIE Newsroom. SPIE-Intl Soc Optical Eng; 2013 Mar 11;

Published In

SPIE Newsroom

DOI

10.1117/2.3201303.11

EISSN

1818-2259

Publication Date

March 11, 2013

Publisher

SPIE-Intl Soc Optical Eng