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Point defect characterization in HAADF-STEM images using multivariate statistical analysis

Publication ,  Journal Article
Sarahan, MC; Chi, M; Masiel, DJ; Browning, ND
Published in: Ultramicroscopy
February 1, 2011

Quantitative analysis of point defects is demonstrated through the use of multivariate statistical analysis. This analysis consists of principal component analysis for dimensional estimation and reduction, followed by independent component analysis to obtain physically meaningful, statistically independent factor images. Results from these analyses are presented in the form of factor images and scores. Factor images show characteristic intensity variations corresponding to physical structure changes, while scores relate how much those variations are present in the original data. The application of this technique is demonstrated on a set of experimental images of dislocation cores along a low-angle tilt grain boundary in strontium titanate. A relationship between chemical composition and lattice strain is highlighted in the analysis results, with picometer-scale shifts in several columns measurable from compositional changes in a separate column. © 2010 Elsevier B.V.

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Published In

Ultramicroscopy

DOI

ISSN

0304-3991

Publication Date

February 1, 2011

Volume

111

Issue

3

Start / End Page

251 / 257

Related Subject Headings

  • Microscopy
  • 5104 Condensed matter physics
  • 3406 Physical chemistry
  • 3101 Biochemistry and cell biology
  • 0299 Other Physical Sciences
  • 0205 Optical Physics
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
 

Citation

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Sarahan, M. C., Chi, M., Masiel, D. J., & Browning, N. D. (2011). Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy, 111(3), 251–257. https://doi.org/10.1016/j.ultramic.2010.11.033
Sarahan, M. C., M. Chi, D. J. Masiel, and N. D. Browning. “Point defect characterization in HAADF-STEM images using multivariate statistical analysis.” Ultramicroscopy 111, no. 3 (February 1, 2011): 251–57. https://doi.org/10.1016/j.ultramic.2010.11.033.
Sarahan MC, Chi M, Masiel DJ, Browning ND. Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy. 2011 Feb 1;111(3):251–7.
Sarahan, M. C., et al. “Point defect characterization in HAADF-STEM images using multivariate statistical analysis.” Ultramicroscopy, vol. 111, no. 3, Feb. 2011, pp. 251–57. Scopus, doi:10.1016/j.ultramic.2010.11.033.
Sarahan MC, Chi M, Masiel DJ, Browning ND. Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy. 2011 Feb 1;111(3):251–257.
Journal cover image

Published In

Ultramicroscopy

DOI

ISSN

0304-3991

Publication Date

February 1, 2011

Volume

111

Issue

3

Start / End Page

251 / 257

Related Subject Headings

  • Microscopy
  • 5104 Condensed matter physics
  • 3406 Physical chemistry
  • 3101 Biochemistry and cell biology
  • 0299 Other Physical Sciences
  • 0205 Optical Physics
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics