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Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures

Publication ,  Journal Article
Marshall, MSJ; Kumah, DP; Reiner, JW; Baddorf, AP; Ahn, CH; Walker, FJ
Published in: Applied Physics Letters
September 3, 2012
Published version (DOI)

Thin films of epitaxial SrTiO 3 grown on silicon exhibit compressive in-plane strain that may stabilize ferroelectricity in this normally non-ferroelectric material. We investigate this possibility by using an ultra-high vacuum atomic force microscope to measure the local force response of coherently strained SrTiO 3 films on silicon to an applied ac electric field. The observed cantilever response is different in regions that were previously written with positive and negative voltages, but the frequency dependence of this response indicates that the dominant forces are related to electrostatic charging rather than ferroelectricity. © 2012 American Institute of Physics.

Duke Scholars

Divine P Kumah
Author Divine P Kumah Physics

Published In

Applied Physics Letters

DOI

10.1063/1.4750243

ISSN

0003-6951

Publication Date

September 3, 2012

Volume

101

Issue

10

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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MLA
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Marshall, M. S. J., Kumah, D. P., Reiner, J. W., Baddorf, A. P., Ahn, C. H., & Walker, F. J. (2012). Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures. Applied Physics Letters, 101(10). https://doi.org/10.1063/1.4750243
Marshall, M. S. J., D. P. Kumah, J. W. Reiner, A. P. Baddorf, C. H. Ahn, and F. J. Walker. “Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures.” Applied Physics Letters 101, no. 10 (September 3, 2012). https://doi.org/10.1063/1.4750243.
Marshall MSJ, Kumah DP, Reiner JW, Baddorf AP, Ahn CH, Walker FJ. Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures. Applied Physics Letters. 2012 Sep 3;101(10).
Marshall, M. S. J., et al. “Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures.” Applied Physics Letters, vol. 101, no. 10, Sept. 2012. Scopus, doi:10.1063/1.4750243.
Marshall MSJ, Kumah DP, Reiner JW, Baddorf AP, Ahn CH, Walker FJ. Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures. Applied Physics Letters. 2012 Sep 3;101(10).

Published In

Applied Physics Letters

DOI

10.1063/1.4750243

ISSN

0003-6951

Publication Date

September 3, 2012

Volume

101

Issue

10

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences