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Stancil, Robert F., Alec E. Forsman, and James W. Williams. “<title>NAWCAD photogrammetrics: methods and applications for aviation test and evaluation</title>.” In SPIE Proceedings, edited by Andrew Davidhazy, Takeharu G. Etoh, C Bruce Johnson, Donald R. Snyder, and James S. Walton, 3173:232–40. SPIE, 1997. https://doi.org/10.1117/12.294515.

Stancil RF, Forsman AE, Williams JW. <title>NAWCAD photogrammetrics: methods and applications for aviation test and evaluation</title>. In: Davidhazy A, Etoh TG, Johnson CB, Snyder DR, Walton JS, editors. SPIE Proceedings. SPIE; 1997. p. 232–40.

Stancil, Robert F., et al. “<title>NAWCAD photogrammetrics: methods and applications for aviation test and evaluation</title>.” SPIE Proceedings, edited by Andrew Davidhazy et al., vol. 3173, SPIE, 1997, pp. 232–40. Crossref, doi:10.1117/12.294515.

Stancil RF, Forsman AE, Williams JW. <title>NAWCAD photogrammetrics: methods and applications for aviation test and evaluation</title>. In: Davidhazy A, Etoh TG, Johnson CB, Snyder DR, Walton JS, editors. SPIE Proceedings. SPIE; 1997. p. 232–240.