Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI)
Publication
, Conference
Hurlock, AX; Koh, T; Martinez, M; Gehm, ME
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2023
X-ray Phase Contrast Imaging (XPCI) is an imaging method used to retrieve phase information from an object, thereby revealing more object characteristics, such as refractive index and thickness. Edge Illumination (EI) is a non-interferometric type of XPCI that is spatially dependent. We developed and simulated an alternative type of EI known as Spectrally Responsive Edge Illumination (SREI), which is energy dependent and utilizes an energy-resolving detector. SREI is intended to be more easily implementable than EI due to fewer precision limitations. We will detail results of our SREI experimental investigation and our plan going forward.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2023
Volume
12531
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Hurlock, A. X., Koh, T., Martinez, M., & Gehm, M. E. (2023). Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 12531). https://doi.org/10.1117/12.2663798
Hurlock, A. X., T. Koh, M. Martinez, and M. E. Gehm. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2663798.
Hurlock AX, Koh T, Martinez M, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In: Proceedings of SPIE - The International Society for Optical Engineering. 2023.
Hurlock, A. X., et al. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” Proceedings of SPIE - The International Society for Optical Engineering, vol. 12531, 2023. Scopus, doi:10.1117/12.2663798.
Hurlock AX, Koh T, Martinez M, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). Proceedings of SPIE - The International Society for Optical Engineering. 2023.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2023
Volume
12531
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering