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Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI)

Publication ,  Conference
Hurlock, AX; Koh, T; Martinez, M; Gehm, ME
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2023

X-ray Phase Contrast Imaging (XPCI) is an imaging method used to retrieve phase information from an object, thereby revealing more object characteristics, such as refractive index and thickness. Edge Illumination (EI) is a non-interferometric type of XPCI that is spatially dependent. We developed and simulated an alternative type of EI known as Spectrally Responsive Edge Illumination (SREI), which is energy dependent and utilizes an energy-resolving detector. SREI is intended to be more easily implementable than EI due to fewer precision limitations. We will detail results of our SREI experimental investigation and our plan going forward.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2023

Volume

12531

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Hurlock, A. X., Koh, T., Martinez, M., & Gehm, M. E. (2023). Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 12531). https://doi.org/10.1117/12.2663798
Hurlock, A. X., T. Koh, M. Martinez, and M. E. Gehm. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2663798.
Hurlock AX, Koh T, Martinez M, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In: Proceedings of SPIE - The International Society for Optical Engineering. 2023.
Hurlock, A. X., et al. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” Proceedings of SPIE - The International Society for Optical Engineering, vol. 12531, 2023. Scopus, doi:10.1117/12.2663798.
Hurlock AX, Koh T, Martinez M, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). Proceedings of SPIE - The International Society for Optical Engineering. 2023.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2023

Volume

12531

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering