Oxley, M. P., Lou, W., Yoon, M., & Chi, M. (2023). Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations. Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(Supplement_1), 743–744. https://doi.org/10.1093/micmic/ozad067.366

Oxley, Mark P., Wei Lou, M. Yoon, and M. Chi. “Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations.” Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 29, no. Supplement_1 (July 2023): 743–44. https://doi.org/10.1093/micmic/ozad067.366.

Oxley MP, Lou W, Yoon M, Chi M. Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 2023 Jul;29(Supplement_1):743–4.

Oxley, Mark P., et al. “Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations.” Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 29, no. Supplement_1, July 2023, pp. 743–44. Epmc, doi:10.1093/micmic/ozad067.366.

Oxley MP, Lou W, Yoon M, Chi M. Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 2023 Jul;29(Supplement_1):743–744.