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Comparison of approaches for risk-modulated CAD

Publication ,  Conference
Giger, ML; Lan, L; Huo, Z; Vyborny, CJ; Li, H
Published in: Proceedings of SPIE - The International Society for Optical Engineering
September 15, 2003

We compared computerized methods that incorporate automated lesion characterization and methods for the assessment of the breast parenchymal pattern on mammograms in order to better predict the pathological status of a breast lesion. Computer-extracted mass feature automatically characterized the shape, speculation, contrast, and margin of each lesion. On the digitized mammogram of the contralateral breast, computer-extracted texture features were automatically extracted to characterize the radiographic breast parenchymal patterns. Three approaches were investigated. A computerized risk-modulated analysis system for mammographic images is expected to improve characterization of lesions by incorporating cancer-risk information into the decision-making process.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

September 15, 2003

Volume

5032 I

Start / End Page

102 / 105

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Giger, M. L., Lan, L., Huo, Z., Vyborny, C. J., & Li, H. (2003). Comparison of approaches for risk-modulated CAD. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5032 I, pp. 102–105). https://doi.org/10.1117/12.481395
Giger, M. L., L. Lan, Z. Huo, C. J. Vyborny, and H. Li. “Comparison of approaches for risk-modulated CAD.” In Proceedings of SPIE - The International Society for Optical Engineering, 5032 I:102–5, 2003. https://doi.org/10.1117/12.481395.
Giger ML, Lan L, Huo Z, Vyborny CJ, Li H. Comparison of approaches for risk-modulated CAD. In: Proceedings of SPIE - The International Society for Optical Engineering. 2003. p. 102–5.
Giger, M. L., et al. “Comparison of approaches for risk-modulated CAD.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5032 I, 2003, pp. 102–05. Scopus, doi:10.1117/12.481395.
Giger ML, Lan L, Huo Z, Vyborny CJ, Li H. Comparison of approaches for risk-modulated CAD. Proceedings of SPIE - The International Society for Optical Engineering. 2003. p. 102–105.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

September 15, 2003

Volume

5032 I

Start / End Page

102 / 105

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering