Mode shape measurement system with temperature variation function
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Ishii, T; Watanabe, Y; Yano, Y; Goka, S; Sato, T; Sekimoto, H
Published in: 2010 IEEE International Frequency Control Symposium Fcs 2010
October 19, 2010
A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C. ©2010 IEEE.
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2010 IEEE International Frequency Control Symposium Fcs 2010
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Publication Date
October 19, 2010
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384 / 387
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Ishii, T., Watanabe, Y., Yano, Y., Goka, S., Sato, T., & Sekimoto, H. (2010). Mode shape measurement system with temperature variation function. In 2010 IEEE International Frequency Control Symposium Fcs 2010 (pp. 384–387). https://doi.org/10.1109/FREQ.2010.5556305
Ishii, T., Y. Watanabe, Y. Yano, S. Goka, T. Sato, and H. Sekimoto. “Mode shape measurement system with temperature variation function.” In 2010 IEEE International Frequency Control Symposium Fcs 2010, 384–87, 2010. https://doi.org/10.1109/FREQ.2010.5556305.
Ishii T, Watanabe Y, Yano Y, Goka S, Sato T, Sekimoto H. Mode shape measurement system with temperature variation function. In: 2010 IEEE International Frequency Control Symposium Fcs 2010. 2010. p. 384–7.
Ishii, T., et al. “Mode shape measurement system with temperature variation function.” 2010 IEEE International Frequency Control Symposium Fcs 2010, 2010, pp. 384–87. Scopus, doi:10.1109/FREQ.2010.5556305.
Ishii T, Watanabe Y, Yano Y, Goka S, Sato T, Sekimoto H. Mode shape measurement system with temperature variation function. 2010 IEEE International Frequency Control Symposium Fcs 2010. 2010. p. 384–387.
Published In
2010 IEEE International Frequency Control Symposium Fcs 2010
DOI
Publication Date
October 19, 2010
Start / End Page
384 / 387