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Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors

Publication ,  Conference
Cothard, NF; Ali, AM; Austermann, JE; Choi, SK; Crowley, KT; Dober, BJ; Duell, CJ; Duff, SM; Gallardo, P; Hilton, GC; Ho, SPP; Hubmayr, J ...
Published in: Proceedings of SPIE the International Society for Optical Engineering
January 1, 2020

The Simons Observatory (SO) will perform ground-based observations of the cosmic microwave background (CMB) with several small and large aperture telescopes, each outfitted with thousands to tens of thousands of superconducting aluminum manganese (AlMn) transition-edge sensor bolometers (TESs). In-situ characterization of TES responsivities and effective time constants will be required multiple times each observing-day for calibrating time-streams during CMB map-making. Effective time constants are typically estimated in the field by briefly applying small amplitude square-waves on top of the TES DC biases, and fitting exponential decays in the bolometer response. These so-called "bias step"measurements can be rapidly implemented across entire arrays and therefore are attractive because they take up little observing time. However, individual detector complex impedance measurements, while too slow to implement during observations, can provide a fuller picture of the TES model and a better understanding of its temporal response. Here, we present the results of dark TES characterization of many prototype SO bolometers and compare the effective thermal time constants measured via bias steps to those derived from complex impedance data.

Duke Scholars

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2020

Volume

11453

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Cothard, N. F., Ali, A. M., Austermann, J. E., Choi, S. K., Crowley, K. T., Dober, B. J., … Xu, Z. (2020). Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors. In Proceedings of SPIE the International Society for Optical Engineering (Vol. 11453). https://doi.org/10.1117/12.2575912
Cothard, N. F., A. M. Ali, J. E. Austermann, S. K. Choi, K. T. Crowley, B. J. Dober, C. J. Duell, et al. “Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors.” In Proceedings of SPIE the International Society for Optical Engineering, Vol. 11453, 2020. https://doi.org/10.1117/12.2575912.
Cothard NF, Ali AM, Austermann JE, Choi SK, Crowley KT, Dober BJ, et al. Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors. In: Proceedings of SPIE the International Society for Optical Engineering. 2020.
Cothard, N. F., et al. “Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors.” Proceedings of SPIE the International Society for Optical Engineering, vol. 11453, 2020. Scopus, doi:10.1117/12.2575912.
Cothard NF, Ali AM, Austermann JE, Choi SK, Crowley KT, Dober BJ, Duell CJ, Duff SM, Gallardo P, Hilton GC, Ho SPP, Hubmayr J, Link MJ, Niemack MD, Sonka RF, Staggs ST, Vavagiakis EM, Wollack EJ, Xu Z. Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors. Proceedings of SPIE the International Society for Optical Engineering. 2020.

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2020

Volume

11453

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering