Skip to main content

Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI)

Publication ,  Conference
Hurlock, AX; Ruiz, SD; Koh, T; Gehm, ME
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2024

As opposed to transmission imaging, X-ray Phase Contrast Imaging (XPCI) produces images with higher contrast and allows us to distinguish between materials that are weakly attenuating or between materials that possess similar attenuation values. Edge Illumination (EI), a type of XPCI, utilizes spatial variation to uncover information about an object's phase properties, such as the index of refraction. Instead of spatial variation, we previously proposed an alternative EI method, Spectrally Responsive Edge Illumination (SREI), which relies on energy variation. Prior SREI experimental efforts struggled to meet the necessary component performance requirements, so, as an intermediate step, we are currently focused on developing an energy resolving X-ray refractometer and a related database of materials. In this paper we will share our theory and initial proof of concept experimental results, as well as our next steps.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2024

Volume

13043

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Hurlock, A. X., Ruiz, S. D., Koh, T., & Gehm, M. E. (2024). Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 13043). https://doi.org/10.1117/12.3013285
Hurlock, A. X., S. D. Ruiz, T. Koh, and M. E. Gehm. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 13043, 2024. https://doi.org/10.1117/12.3013285.
Hurlock AX, Ruiz SD, Koh T, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). In: Proceedings of SPIE - The International Society for Optical Engineering. 2024.
Hurlock, A. X., et al. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” Proceedings of SPIE - The International Society for Optical Engineering, vol. 13043, 2024. Scopus, doi:10.1117/12.3013285.
Hurlock AX, Ruiz SD, Koh T, Gehm ME. Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI). Proceedings of SPIE - The International Society for Optical Engineering. 2024.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

EISSN

1996-756X

ISSN

0277-786X

Publication Date

January 1, 2024

Volume

13043

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering