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Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit

Publication ,  Journal Article
Lin, H; Chung, HSH; Lin, C; Xie, D; Deng, Q; Lyu, M; Goetz, SM; Chen, J; Ge, X
Published in: IEEE Transactions on Power Electronics
January 1, 2026

The cascaded H-bridge multilevel converter (CHBMC) is widely used in medium- and high-voltage applications due to its flexibility and scalability. However, its numerous switches make it prone to open-circuit (OC) faults, which lead to overshoot currents and increased harmonics, while unbalanced dc capacitor voltages can destabilize the system. To resolve the aforementioned issues, this article proposes an enhanced space vector modulation (E-SVM) unit that uses counters for multiple OC switch fault diagnosis and incorporates dc capacitor voltage balancing capability. In conjunction with the E-SVM unit, the zero level per power cell helps identify faulty switches, while redundant space vectors balance dc capacitor voltages. Switching losses are minimized by optimizing the switching transition, and a voltage balancing degree quantifies the boundary of the unbalanced loads. The E-SVM is software-based, level-independent, and control-agnostic by the control unit. It ensures seamless CHBMC operation. Its effectiveness is demonstrated by comparing the verification results with theoretical predictions.

Duke Scholars

Published In

IEEE Transactions on Power Electronics

DOI

EISSN

1941-0107

ISSN

0885-8993

Publication Date

January 1, 2026

Volume

41

Issue

2

Start / End Page

2358 / 2376

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 0906 Electrical and Electronic Engineering
 

Citation

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Lin, H., Chung, H. S. H., Lin, C., Xie, D., Deng, Q., Lyu, M., … Ge, X. (2026). Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit. IEEE Transactions on Power Electronics, 41(2), 2358–2376. https://doi.org/10.1109/TPEL.2025.3618228
Lin, H., H. S. H. Chung, C. Lin, D. Xie, Q. Deng, M. Lyu, S. M. Goetz, J. Chen, and X. Ge. “Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit.” IEEE Transactions on Power Electronics 41, no. 2 (January 1, 2026): 2358–76. https://doi.org/10.1109/TPEL.2025.3618228.
Lin H, Chung HSH, Lin C, Xie D, Deng Q, Lyu M, et al. Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit. IEEE Transactions on Power Electronics. 2026 Jan 1;41(2):2358–76.
Lin, H., et al. “Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit.” IEEE Transactions on Power Electronics, vol. 41, no. 2, Jan. 2026, pp. 2358–76. Scopus, doi:10.1109/TPEL.2025.3618228.
Lin H, Chung HSH, Lin C, Xie D, Deng Q, Lyu M, Goetz SM, Chen J, Ge X. Improved Fault Diagnosis Capability in CHBMCs: Counter Design for Multiple OC Switches via an E-SVM Unit. IEEE Transactions on Power Electronics. 2026 Jan 1;41(2):2358–2376.

Published In

IEEE Transactions on Power Electronics

DOI

EISSN

1941-0107

ISSN

0885-8993

Publication Date

January 1, 2026

Volume

41

Issue

2

Start / End Page

2358 / 2376

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4008 Electrical engineering
  • 0906 Electrical and Electronic Engineering