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Bayesian sequential reliability for Weibull and related distributions

Publication ,  Journal Article
Sun, D; Berger, JO
Published in: Annals of the Institute of Statistical Mathematics
June 1, 1994

Assume that the probability density function for the lifetime of a newly designed product has the form: [H′(t)/Q(θ)] exp{-H(t)/Q(θ)}. The Exponential ε(θ), Rayleigh, Weibull W(θ, β) and Pareto pdf's are special cases. Q(θ) will be assumed to have an inverse Gamma prior. Assume that m independent products are to be tested with replacement. A Bayesian Sequential Reliability Demonstration Testing plan is used to eigher accept the product and start formal production, or reject the product for reengineering. The test criterion is the intersection of two goals, a minimal goal to begin production and a mature product goal. The exact values of various risks and the distribution of total number of failures are evaluated. Based on a result about a Poisson process, the expected stopping time for the exponential failure time is also found. Included in these risks and expected stopping times are frequentist versions, thereof, so that the results also provide frequentist answers for a class of interesting stopping rules. © 1994 The Institute of Statistical Mathematics.

Duke Scholars

Published In

Annals of the Institute of Statistical Mathematics

DOI

EISSN

1572-9052

ISSN

0020-3157

Publication Date

June 1, 1994

Volume

46

Issue

2

Start / End Page

221 / 249

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics
 

Citation

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Sun, D., & Berger, J. O. (1994). Bayesian sequential reliability for Weibull and related distributions. Annals of the Institute of Statistical Mathematics, 46(2), 221–249. https://doi.org/10.1007/BF01720582
Sun, D., and J. O. Berger. “Bayesian sequential reliability for Weibull and related distributions.” Annals of the Institute of Statistical Mathematics 46, no. 2 (June 1, 1994): 221–49. https://doi.org/10.1007/BF01720582.
Sun D, Berger JO. Bayesian sequential reliability for Weibull and related distributions. Annals of the Institute of Statistical Mathematics. 1994 Jun 1;46(2):221–49.
Sun, D., and J. O. Berger. “Bayesian sequential reliability for Weibull and related distributions.” Annals of the Institute of Statistical Mathematics, vol. 46, no. 2, June 1994, pp. 221–49. Scopus, doi:10.1007/BF01720582.
Sun D, Berger JO. Bayesian sequential reliability for Weibull and related distributions. Annals of the Institute of Statistical Mathematics. 1994 Jun 1;46(2):221–249.
Journal cover image

Published In

Annals of the Institute of Statistical Mathematics

DOI

EISSN

1572-9052

ISSN

0020-3157

Publication Date

June 1, 1994

Volume

46

Issue

2

Start / End Page

221 / 249

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics