Studying the insulator-conductor interface with a scanning tunneling microscope
Publication
, Journal Article
Sumetskii, MI; Baranger, HU
Published in: Applied Physics Letters
January 1, 1995
We suggest that a scanning tunneling microscope (STM) may be used for investigating the insulator-conductor interface, in particular SiO2/Si, at nanometer scale. For an insulating film transparent to tunneling, we estimate, using a simple model, the roughness of the interface from the STM image. It is found that the interface roughness is less than the roughness of the image surface times the ratio of effective decay lengths in the film and in vacuum. For relatively wide films, of order 10 nm, STM measurement in the field emission regime can give the interface image with 1 nm precision.© 1995 American Institute of Physics.
Duke Scholars
Published In
Applied Physics Letters
DOI
ISSN
0003-6951
Publication Date
January 1, 1995
Start / End Page
1352
Related Subject Headings
- Applied Physics
- 51 Physical sciences
- 40 Engineering
- 10 Technology
- 09 Engineering
- 02 Physical Sciences
Citation
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Sumetskii, M. I., & Baranger, H. U. (1995). Studying the insulator-conductor interface with a scanning tunneling microscope. Applied Physics Letters, 1352. https://doi.org/10.1063/1.113198
Sumetskii, M. I., and H. U. Baranger. “Studying the insulator-conductor interface with a scanning tunneling microscope.” Applied Physics Letters, January 1, 1995, 1352. https://doi.org/10.1063/1.113198.
Sumetskii MI, Baranger HU. Studying the insulator-conductor interface with a scanning tunneling microscope. Applied Physics Letters. 1995 Jan 1;1352.
Sumetskii, M. I., and H. U. Baranger. “Studying the insulator-conductor interface with a scanning tunneling microscope.” Applied Physics Letters, Jan. 1995, p. 1352. Scopus, doi:10.1063/1.113198.
Sumetskii MI, Baranger HU. Studying the insulator-conductor interface with a scanning tunneling microscope. Applied Physics Letters. 1995 Jan 1;1352.
Published In
Applied Physics Letters
DOI
ISSN
0003-6951
Publication Date
January 1, 1995
Start / End Page
1352
Related Subject Headings
- Applied Physics
- 51 Physical sciences
- 40 Engineering
- 10 Technology
- 09 Engineering
- 02 Physical Sciences