Stress activated Raman scattering and microcrack detection
Publication
, Journal Article
Ciftan, M; Brown, RG; Saibel, E
Published in: International Journal of Engineering Science
January 1, 1983
A new technique for the detection of microcrack precursors and for the study of the dynamics of crack propagation is proposed. The technique uses laser Raman scattering off of adsorbed surface species to detect microcrack precursors via variations in the Raman spectrum associated with the stresses localized within such precursors. We give extensive theoretical justification and detail several approaches designed to substantiate the plausability of the technique proposed. This technique can become a valuable tool for the detection of microcrack precursors as well as studies of phenomena including adsorption, catalysis. adhesion, wear and the dynamics of stress-corrosion cracking. © 1983.
Duke Scholars
Published In
International Journal of Engineering Science
DOI
ISSN
0020-7225
Publication Date
January 1, 1983
Volume
21
Issue
11
Start / End Page
1285 / 1293
Related Subject Headings
- Mechanical Engineering & Transports
- 0905 Civil Engineering
- 0102 Applied Mathematics
Citation
APA
Chicago
ICMJE
MLA
NLM
Ciftan, M., Brown, R. G., & Saibel, E. (1983). Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science, 21(11), 1285–1293. https://doi.org/10.1016/0020-7225(83)90125-8
Ciftan, M., R. G. Brown, and E. Saibel. “Stress activated Raman scattering and microcrack detection.” International Journal of Engineering Science 21, no. 11 (January 1, 1983): 1285–93. https://doi.org/10.1016/0020-7225(83)90125-8.
Ciftan M, Brown RG, Saibel E. Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science. 1983 Jan 1;21(11):1285–93.
Ciftan, M., et al. “Stress activated Raman scattering and microcrack detection.” International Journal of Engineering Science, vol. 21, no. 11, Jan. 1983, pp. 1285–93. Scopus, doi:10.1016/0020-7225(83)90125-8.
Ciftan M, Brown RG, Saibel E. Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science. 1983 Jan 1;21(11):1285–1293.
Published In
International Journal of Engineering Science
DOI
ISSN
0020-7225
Publication Date
January 1, 1983
Volume
21
Issue
11
Start / End Page
1285 / 1293
Related Subject Headings
- Mechanical Engineering & Transports
- 0905 Civil Engineering
- 0102 Applied Mathematics