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Correction for specimen movement after acquisition of element-specific electron microprobe images.

Publication ,  Journal Article
Lamvik, MK; Ingram, P; Menon, RG; Beese, LS; Davilla, SD; LeFurgey, A
Published in: J Microsc
November 1989

Because a long time is generally required to generate X-ray maps of specific elements by electron beam methods, images are subject to a loss of resolution due to stage movement. Methods have been previously described for correcting stage drift during exposure by sensing the drift and deflecting the beam to follow the stage; but these methods require modifications of the equipment. When the drift is not excessive, it is possible to correct a series of images after the exposure series is finished. Here we demonstrate two methods for correcting the drift, one based on manual assignment of specimen position and one on the use of cross-correlation functions to determine objectively the misalignment of images in the series. The success of the methods is illustrated in calcium-specific images of a bone section that show the collagen periodicity after drift correction.

Duke Scholars

Published In

J Microsc

DOI

ISSN

0022-2720

Publication Date

November 1989

Volume

156

Issue

Pt 2

Start / End Page

183 / 190

Location

England

Related Subject Headings

  • Motion
  • Microscopy, Electron
  • Microscopy
  • Image Processing, Computer-Assisted
  • Humans
  • Electron Probe Microanalysis
  • Collagen
  • Bone and Bones
  • 4016 Materials engineering
  • 3406 Physical chemistry
 

Citation

APA
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ICMJE
MLA
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Lamvik, M. K., Ingram, P., Menon, R. G., Beese, L. S., Davilla, S. D., & LeFurgey, A. (1989). Correction for specimen movement after acquisition of element-specific electron microprobe images. J Microsc, 156(Pt 2), 183–190. https://doi.org/10.1111/j.1365-2818.1989.tb02917.x
Lamvik, M. K., P. Ingram, R. G. Menon, L. S. Beese, S. D. Davilla, and A. LeFurgey. “Correction for specimen movement after acquisition of element-specific electron microprobe images.J Microsc 156, no. Pt 2 (November 1989): 183–90. https://doi.org/10.1111/j.1365-2818.1989.tb02917.x.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. J Microsc. 1989 Nov;156(Pt 2):183–90.
Lamvik, M. K., et al. “Correction for specimen movement after acquisition of element-specific electron microprobe images.J Microsc, vol. 156, no. Pt 2, Nov. 1989, pp. 183–90. Pubmed, doi:10.1111/j.1365-2818.1989.tb02917.x.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. J Microsc. 1989 Nov;156(Pt 2):183–190.
Journal cover image

Published In

J Microsc

DOI

ISSN

0022-2720

Publication Date

November 1989

Volume

156

Issue

Pt 2

Start / End Page

183 / 190

Location

England

Related Subject Headings

  • Motion
  • Microscopy, Electron
  • Microscopy
  • Image Processing, Computer-Assisted
  • Humans
  • Electron Probe Microanalysis
  • Collagen
  • Bone and Bones
  • 4016 Materials engineering
  • 3406 Physical chemistry