Scholars@Duke

Magnetic nanowire based high resolution magnetic force microscope probes

Publication ,  Journal Article
Yang, G; Tang, J; Kato, S; Zhang, Q; Qin, LC; Woodson, M; Liu, J; Kim, JW; Littlehei, PT; Park, C; Zhou, O
Published in: Applied Physics Letters
September 19, 2005
Published version (DOI)

We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized. © 2005 American Institute of Physics.

Duke Scholars

Jie Liu
Author Jie Liu Chemistry

Published In

Applied Physics Letters

DOI

10.1063/1.2043237

ISSN

0003-6951

Publication Date

September 19, 2005

Volume

87

Issue

12

Start / End Page

1 / 3

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Yang, G., Tang, J., Kato, S., Zhang, Q., Qin, L. C., Woodson, M., … Zhou, O. (2005). Magnetic nanowire based high resolution magnetic force microscope probes. Applied Physics Letters, 87(12), 1–3. https://doi.org/10.1063/1.2043237
Yang, G., J. Tang, S. Kato, Q. Zhang, L. C. Qin, M. Woodson, J. Liu, et al. “Magnetic nanowire based high resolution magnetic force microscope probes.” Applied Physics Letters 87, no. 12 (September 19, 2005): 1–3. https://doi.org/10.1063/1.2043237.
Yang G, Tang J, Kato S, Zhang Q, Qin LC, Woodson M, et al. Magnetic nanowire based high resolution magnetic force microscope probes. Applied Physics Letters. 2005 Sep 19;87(12):1–3.
Yang, G., et al. “Magnetic nanowire based high resolution magnetic force microscope probes.” Applied Physics Letters, vol. 87, no. 12, Sept. 2005, pp. 1–3. Scopus, doi:10.1063/1.2043237.
Yang G, Tang J, Kato S, Zhang Q, Qin LC, Woodson M, Liu J, Kim JW, Littlehei PT, Park C, Zhou O. Magnetic nanowire based high resolution magnetic force microscope probes. Applied Physics Letters. 2005 Sep 19;87(12):1–3.

Published In

Applied Physics Letters

DOI

10.1063/1.2043237

ISSN

0003-6951

Publication Date

September 19, 2005

Volume

87

Issue

12

Start / End Page

1 / 3

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences