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Portable surface-enhanced Raman toxic chemical analyzer development

Publication ,  Journal Article
Selph, WE; Tran, KC; Hurwitz, M; Alarie, JP; Sutherland, WS; Stokes, DL; Pal, T; Vo-Dinh, T
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 1992

GAMMA-METRICS and Oak Ridge National Laboratory have developed a prototype portable toxic chemical analyzer (TCA) for environmental screening using surface enhanced Raman scattering technology. The focus is on detection of anthropogenic chemicals such as polycyclic aromatic compounds. In this instrument, a laser illuminates a small sample of analyte on a substrate of silver coated particles. Light scattered from the illuminated spot is analyzed to determine the chemicals in the analyte. The development process involved miniaturizing the instrument from a large laboratory table-top device to a small portable package, then ruggedizing the components and the packaging to withstand field conditions. A reference design for a commercial instrument has been developed. The instrument employs internal direct optics or, optionally, an external, in-situ probe connected by fiber optics to

Duke Scholars

Tuan Vo-Dinh
Author Tuan Vo-Dinh Biomedical Engineering

Published In

Proceedings of SPIE - The International Society for Optical Engineering

ISSN

0277-786X

Publication Date

January 1, 1992

Volume

1637

Start / End Page

180 / 188

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Selph, W. E., Tran, K. C., Hurwitz, M., Alarie, J. P., Sutherland, W. S., Stokes, D. L., … Vo-Dinh, T. (1992). Portable surface-enhanced Raman toxic chemical analyzer development. Proceedings of SPIE - The International Society for Optical Engineering, 1637, 180–188.
Selph, W. E., K. C. Tran, M. Hurwitz, J. P. Alarie, W. S. Sutherland, D. L. Stokes, T. Pal, and T. Vo-Dinh. “Portable surface-enhanced Raman toxic chemical analyzer development.” Proceedings of SPIE - The International Society for Optical Engineering 1637 (January 1, 1992): 180–88.
Selph WE, Tran KC, Hurwitz M, Alarie JP, Sutherland WS, Stokes DL, et al. Portable surface-enhanced Raman toxic chemical analyzer development. Proceedings of SPIE - The International Society for Optical Engineering. 1992 Jan 1;1637:180–8.
Selph, W. E., et al. “Portable surface-enhanced Raman toxic chemical analyzer development.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 1637, Jan. 1992, pp. 180–88.
Selph WE, Tran KC, Hurwitz M, Alarie JP, Sutherland WS, Stokes DL, Pal T, Vo-Dinh T. Portable surface-enhanced Raman toxic chemical analyzer development. Proceedings of SPIE - The International Society for Optical Engineering. 1992 Jan 1;1637:180–188.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

ISSN

0277-786X

Publication Date

January 1, 1992

Volume

1637

Start / End Page

180 / 188

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering